參數(shù)資料
型號: SN54BCT8240AFK
廠商: Texas Instruments, Inc.
英文描述: SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
中文描述: 掃描測試設(shè)備與八進(jìn)制反向緩沖器
文件頁數(shù): 18/26頁
文件大?。?/td> 473K
代理商: SN54BCT8240AFK
SN54BCT8240A, SN74BCT8240A
SCAN TEST DEVICES
WITH OCTAL INVERTING BUFFERS
SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996
18
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 9)
VCC = 5 V,
TA = 25
°
C
MIN
SN54BCT8240A
SN74BCT8240A
UNIT
MAX
MIN
MAX
MIN
MAX
fclock
Clock frequency
TCK
0
20
0
20
0
20
MHz
tw
Pulse duration
TCK high or low
25
25
25
ns
TMS double high
Any A before TCK
Any OE before TCK
TDI before TCK
TMS before TCK
Any A after TCK
Any OE after TCK
TDI after TCK
TMS after TCK
Power up to TCK
50*
50*
50
6
6
6
tsu
Setup time
6
6
6
ns
6
6
6
12
12
12
4.5
4.5
4.5
th
Hold time
4.5
4.5
4.5
ns
4.5
4.5
4.5
0
0
0
td
Delay time
100*
100*
100
ns
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
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