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參數(shù)資料
| 型號(hào)： | SN54AS756FK |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | OCTAL BUFFERS AND LINE DRIVERS WITH OPEN-COLLECTOR OUTPUTS |
| 中文描述： | 八路緩沖器和符合開放的驅(qū)動(dòng)，集電極輸出 |
| 文件頁(yè)數(shù)： | 2/6頁(yè) |
| 文件大?。?/td> | 97K |
| 代理商： | SN54AS756FK |
SN54AS756, SN74AS756, SN74AS757
OCTAL BUFFERS AND LINE DRIVERS
WITH OPEN-COLLECTOR OUTPUTS
SDAS040B – DECEMBER 1983 – REVISED JANUARY 1995
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
logic diagrams (positive logic)
1
2
4
6
8
19
11
13
15
17
3
5
7
9
12
14
16
18
1A1
1A2
1A3
1A4
1Y1
2A1
2A2
2A3
2A4
2Y1
1Y2
1Y3
1Y4
2Y2
2Y3
2Y4
1OE
2OE
1
2
4
6
8
19
11
13
15
17
3
5
7
9
12
14
16
18
1A1
1A2
1A3
1A4
1Y1
2A1
2A2
2A3
2A4
2Y1
1Y2
1Y3
1Y4
2Y2
2Y3
2Y4
1OE
2OE
′
AS756
SN74AS757
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V
CC
Input voltage, V
I
Off-state output voltage
Operating free-air temperature range, T
A
: SN54AS756
7 V
7 V
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74AS756, SN74AS757
Storage temperature range
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
–55
°
C to 125
°
C
0
°
C to 70
°
C
–65
°
C to 150
°
C
. . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
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