參數(shù)資料
型號(hào): SN54AS08FK
廠商: Texas Instruments, Inc.
英文描述: QUADRUPLE 2-INPUT POSITIVE-AND GATES
中文描述: 四2輸入陽性與門
文件頁數(shù): 5/14頁
文件大小: 497K
代理商: SN54AS08FK
SN54ALS08, SN54AS08, SN74ALS08, SN74AS08
QUADRUPLE 2-INPUT POSITIVE-AND GATES
SDAS191A – APRIL 1982 – REVISED DECEMBER 1994
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
SERIES 54ALS/74ALS AND 54AS/74AS DEVICES
tPHZ
tPLZ
tPHL
tPLH
0.3 V
tPZL
tPZH
tPLH
tPHL
LOAD CIRCUIT
FOR 3-STATE OUTPUTS
From Output
Under Test
Test
Point
R1
S1
CL
(see Note A)
7 V
1.3 V
1.3 V
1.3 V
3.5 V
3.5 V
0.3 V
0.3 V
th
tsu
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
Timing
Input
Data
Input
1.3 V
1.3 V
3.5 V
3.5 V
0.3 V
0.3 V
High-Level
Pulse
Low-Level
Pulse
tw
VOLTAGE WAVEFORMS
PULSE DURATIONS
Input
Out-of-Phase
Output
(see Note C)
1.3 V
1.3 V
1.3 V
1.3 V
1.3 V
1.3 V
1.3 V
1.3 V
1.3 V
1.3 V
3.5 V
3.5 V
0.3 V
0.3 V
VOL
VOH
VOH
VOL
Output
Control
(low-level
enabling)
Waveform 1
S1 Closed
(see Note B)
Waveform 2
S1 Open
(see Note B)
0 V
VOH
VOL
3.5 V
In-Phase
Output
0.3 V
1.3 V
1.3 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
R2
VCC
RL
Test
Point
From Output
Under Test
CL
(see Note A)
LOAD CIRCUIT
FOR OPEN-COLLECTOR OUTPUTS
LOAD CIRCUIT FOR
BI-STATE
TOTEM-POLE OUTPUTS
From Output
Under Test
Test
Point
CL
(see Note A)
RL
RL = R1 = R2
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. When measuring propagation delay items of 3-state outputs, switch S1 is open.
D. All input pulses have the following characteristics: PRR
1 MHz, tr = tf = 2 ns, duty cycle = 50%.
E. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuits and Voltage Waveforms
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