參數(shù)資料
型號(hào): SN54ALS273FK
廠(chǎng)商: Texas Instruments, Inc.
元件分類(lèi): 通用總線(xiàn)功能
英文描述: OCTAL D-TYPE FLIP-FLOPS WITH CLEAR
中文描述: 八路D型倒裝,沒(méi)有明確的觸發(fā)器
文件頁(yè)數(shù): 1/6頁(yè)
文件大?。?/td> 93K
代理商: SN54ALS273FK
SN54ALS273, SN74ALS273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SDAS218A – APRIL 1982 – REVISED DECEMBER 1994
Copyright
1994, Texas Instruments Incorporated
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Contain Eight Flip-Flops With Single-Rail
Outputs
Buffered Clock and Direct-Clear Inputs
Individual Data Input to Each Flip-Flop
Applications Include:
Buffer/Storage Registers
Shift Registers
Pattern Generators
Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic (N)
and Ceramic (J) 300-mil DIPs
description
These octal positive-edge-triggered flip-flops
utilize TTL circuitry to implement D-type flip-flop
logic with a direct-clear (CLR) input.
Information at the data (D) inputs meeting the
setup-time requirements is transferred to the
Q outputs on the positive-going edge of the clock
(CLK) pulse. Clock triggering occurs at a particular
voltage level and is not directly related to the
transition time of the positive-going pulse. When
CLK is at either the high or low level, the D input
signal has no effect at the output.
The SN54ALS273 is characterized for operation
over the full military temperature range of –55
°
C
to 125
°
C. The SN74ALS273 is characterized for
operation from 0
°
C to 70
°
C.
FUNCTION TABLE
(each flip-flop)
INPUTS
OUTPUT
Q
CLR
L
CLK
D
X
X
L
H
H
H
H
L
L
H
H or L
X
Q0
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
CLR
1Q
1D
2D
2Q
3Q
3D
4D
4Q
GND
V
CC
8Q
8D
7D
7Q
6Q
6D
5D
5Q
CLK
SN54ALS273 . . . J PACKAGE
SN74ALS273 . . . DW OR N PACKAGE
(TOP VIEW)
3
2 1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
8D
7D
7Q
6Q
6D
2D
2Q
3Q
3D
4D
1
1
C
5
5
8
4
G
C
V
C
SN54ALS273 . . . FK PACKAGE
(TOP VIEW)
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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