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參數(shù)資料
| 型號(hào)： | SN54ALS22BJ |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | DUAL 4-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUTS |
| 中文描述： | 雙4輸入陽(yáng)性與開(kāi)放的NAND蓋茨集電極輸出 |
| 文件頁(yè)數(shù)： | 1/3頁(yè) |
| 文件大?。?/td> | 44K |
| 代理商： | SN54ALS22BJ |
SN54ALS22B, SN74ALS22B
DUAL 4-INPUT POSITIVE-NAND GATES
WITH OPEN-COLLECTOR OUTPUTS
SDAS005A – MARCH 1984 – REVISED MAY 1986
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Copyright
1986, Texas Instruments Incorporated
5BASIC
1
Package Options Include Plastic Small
Outline Packages, Ceramic Chip Carriers,
and Standard Plastic and Ceramic 300-mil
DIPs
Dependable Texas Instruments Quality and
Reliability
description
These devices contain two independent 4-input
NAND gates. They perform the Boolean functions
Y = A
B
C
D or Y = A+B+C+D in positive logic.
The open-collector outputs require pullup
resistors to perform correctly. They may be
connected to other open-collector outputs to
implement active-low wired-OR or active-high
wired-AND functions. Open-collector devices are
often used to generate higher V
OH
levels.
The SN54ALS22B is characterized for operation
over the full military temperature range of 55
°
C
to 125
°
C. The SN74ALS22B is characterized for
operation from 0
°
C to 70
°
C.
FUNCTION TABLE
(each gate)
INPUTS
B
C
H
H
X
X
L
X
X
L
X
X
OUTPUT
Y
L
H
H
H
H
A
H
L
X
X
X
D
H
X
X
X
L
logic symbol
2D13
12
2C
&
8
2Y
6
1Y
2B10
2A9
1D5
1C4
2
1B
1A1
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for D, J, and N packages.
1Y
1D
1A
1B
1C
2C
2B
2A
2D
2Y
logic diagram (positive logic)
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
NC
1C
1D
1Y
GND
V
CC
2D
2C
NC
2B
2A
2Y
SN54ALS22B . . . J PACKAGE
SN74ALS22B . . . D OR N PACKAGE
(TOP VIEW)
3
2
1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
2C
NC
NC
NC
2B
NC
NC
1C
NC
1D
SN54ALS22B . . . FK PACKAGE
(TOP VIEW)
1
1
N
2
2
2
1
G
N
NC–No internal connection
V
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN74ALS22BD | DUAL 4-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUTS |
| SN54ALS22B | Dual 4-Input Positive-Nand Gates With Open-Collector Outputs(雙4輸入正與非門(集電極開(kāi)路輸出)) |
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