參數(shù)資料
型號: SN54AL520
廠商: Texas Instruments, Inc.
英文描述: 8-BIT IDENTITY COMPARATORS
中文描述: 8位身分比較器
文件頁數(shù): 1/9頁
文件大小: 138K
代理商: SN54AL520
SN54ALS520, SN74ALS518, SN74ALS520, SN74ALS521
8-BIT IDENTITY COMPARATORS
SDAS224B – JUNE 1982 – REVISED NOVEMBER 1995
Copyright
1995, Texas Instruments Incorporated
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Compare Two 8-Bit Words
Choice of Totem-Pole or Open-Collector
Outputs
SN74ALS518 and
ALS520 Have 20-k
Pullup Resistors on Q Inputs
Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic (N)
and Ceramic (J) 300-mil DIPs
TYPE
INPUT
PULLUP
RESISTOR
OUTPUT FUNCTION
AND
CONFIGURATION
SN74ALS518
ALS520
SN74ALS521
SN74ALS521 is identical to
ALS688.
description
Yes
P = Q open collector
Yes
P = Q totem pole
No
P = Q totem pole
These identity comparators perform comparisons
on two 8-bit binary or BCD words. The
SN74ALS518 provides P = Q outputs, while the
ALS520 and SN74ALS521 provide P = Q
outputs. The SN74ALS518 has an open-collector
output. The SN74ALS518 and
ALS520 feature
20-k
pullup resistors on the Q inputs for analog
or switch data.
The SN54ALS520 is characterized for operation
over the full military temperature range of –55
°
C
to 125
°
C. The SN74ALS518, SN74ALS520, and
SN74ALS521 are characterized for operation
from 0
°
C to 70
°
C.
FUNCTION TABLE
INPUTS
OUTPUTS
DATA
P, Q
ENABLE
G
P = Q
P = Q
P = Q
L
H
L
P > Q
L
L
H
P < Q
L
L
H
X
H
L
H
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
G
P0
Q0
P1
Q1
P2
Q2
P3
Q3
GND
V
CC
P = Q/P = Q
Q7
P7
Q6
P6
Q5
P5
Q4
P4
SN54ALS520 . . . J PACKAGE
SN74ALS518, SN74ALS520,
SN74ALS521
. . .
DW OR N PACKAGE
(TOP VIEW)
3
2 1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
Q7
P7
Q6
P6
Q5
P1
Q1
P2
Q2
P3
SN54ALS520 . . . FK PACKAGE
(TOP VIEW)
Q
P
G
Q
P
P
Q
G
P
V
C
P = Q for SN74ALS518
P = Q for
ALS520 and SN74ALS521
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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