參數(shù)資料
型號(hào)： SN54ABTH182652AHV
廠商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
中文描述： 掃描測(cè)試設(shè)備與18位總線收發(fā)器和寄存器
文件頁(yè)數(shù)： 1/37頁(yè)
文件大小： 575K
代理商： SN54ABTH182652AHV
SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A
SCAN TEST DEVICES WITH
18-BIT BUS TRANSCEIVERS AND REGISTERS
SCBS167D – AUGUST 1993 – REVISED JULY 1996
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Members of the Texas Instruments
SCOPE
Family of Testability Products
Members of the Texas Instruments
Widebus
Family
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
Include D-Type Flip-Flops and Control
Circuitry to Provide Multiplexed
Transmission of Stored and Real-Time Data
Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
B-Port Outputs of ’ABTH182652A Devices
Have Equivalent 25-
Series Resistors, So
No External Resistors Are Required
State-of-the-Art EPIC-
ΙΙ
B
BiCMOS Design
One Boundary-Scan Cell Per I/O
Architecture Improves Scan Efficiency
SCOPE
Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
Packaged in 64-Pin Plastic Thin Quad Flat
(PM) Packages Using 0.5-mm
Center-to-Center Spacings and 68-Pin
Ceramic Quad Flat (HV) Packages Using
25-mil Center-to-Center Spacings
1B4
1B5
1B6
GND
1B7
1B8
1B9
V
CC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
V
CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
V
N
T
1
1
1
1
G
1
1
T
N
T
2
2
2
G
2
2
2
T
2
2
1
1
G
2
2
2
G
1
1
1
SN54ABTH18652A, SN54ABTH182652A . . . HV PACKAGE
(TOP VIEW)
C
V
C
NC – No internal connection
28 29
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
30
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
31 32 33 34
8 7
6
5
4
9
3
1 68 67
2
35 36 37 38 39
66 65
27
64 63 62 61
40 41 42 43
Copyright
1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
parameters.
SCOPE, Widebus, and EPIC-
ΙΙ
B are trademarks of Texas Instruments Incorporated.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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