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參數(shù)資料
| 型號(hào)： | SN54ABT18502HV |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
| 中文描述： | 掃描測(cè)試設(shè)備與18位注冊(cè)總線收發(fā)器 |
| 文件頁(yè)數(shù)： | 1/29頁(yè) |
| 文件大小： | 409K |
| 代理商： | SN54ABT18502HV |
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SN54ABT18502
SCAN TEST DEVICE WITH
18-BIT REGISTERED BUS TRANSCEIVER
SCBS109C – AUGUST 1992 – REVISED AUGUST 1994
SCOPE
Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs With
Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
Packaged in 68-Pin Ceramic Quad Flat
Package Using 25-mil Center-to-Center
Spacings
Copyright
1994, Texas Instruments Incorporated
4–1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Member of the Texas Instruments SCOPE
Family of Testability Products
Member of the Texas Instruments
Widebus
Family
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
UBT
(Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
Two Boundary-Scan Cells per I/O for
Greater Flexibility
State-of-the-Art EPIC-
ΙΙ
B
BiCMOS Design
Significantly Reduces Power Dissipation
1B4
1B5
1B6
GND
1B7
1B8
1B9
V
CC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
V
CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
V
N
T
1
1
1
1
G
1
1
T
N
T
2
2
2
G
2
2
2
T
2
2
1
1
G
2
2
2
G
1
1
1
SN54ABT18502 . . . HV PACKAGE
(TOP VIEW)
C
V
C
NC – No internal connection
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
10
11
12
13
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20
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22
23
24
25
26
28 29 30 31 32 33 34
8 7
6
5
4
9
3
1 68 67
2
35 36 37 38 39
66 65
27
64 63 62 61
40 41 42 43
SCOPE, Widebus, UBT, and EPIC-
II
B are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54ABT18504HV | CABLE ASSEMBLY; LEAD-FREE SOLDER; 75 OHM TNC MALE TO 75 OHM BNC MALE; 75 OHM, RG59B/U COAX; 12" CABLE LENGTH |
| SN54ABT18504 | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18640 | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS |
| SN74ABT18640DGG | RP10 (EW) Series - Powerline Regulated DC-DC Converters; Input Voltage (Vdc): 48V; Output Voltage (Vdc): 15V; 4:1 Wide Input Voltage Range; 10 Watts Output Power; 1.6kVDC Isolation; Fixed Operating Frequency; Six-Sided Continuous Shield; Standard 50.8 x25.4x10.2mm Package; Efficiency to 84% |
| SN54ABT18640WD | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT18504 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18504_08 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18504HV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABT18640 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS |
| SN54ABT18640WD | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS |
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