參數(shù)資料
型號(hào): SE5537FE
廠商: NXP SEMICONDUCTORS
元件分類(lèi): 運(yùn)動(dòng)控制電子
英文描述: Sample-and-hold amplifier
中文描述: SAMPLE AND HOLD AMPLIFIER, 20 us ACQUISITION TIME, PDIP8
封裝: 0.300 INCH, PLASTIC, DIP-8
文件頁(yè)數(shù): 8/8頁(yè)
文件大?。?/td> 103K
代理商: SE5537FE
Philips Semiconductors Linear Products
Product specification
NE/SE5537
Sample-and-hold amplifier
August 31, 1994
891
V
OUT
Figure 2. Multiplying DAC Application
V
IN
+VREF
IN
NE5537
5k
5008/DAC-08
530
5k
D0-D7
NOTE:
VOUT
VINx
1
256
(20 D0
21D1
27D7) Equation 1
Figure 3. Analog Data Multiplexing
SD5000
NE5537
CONA/D
ANALOG INPUT 1
CONTROL 1
ANALOG INPUT 2
CONTROL 2
ANALOG INPUT 3
CONTROL 3
ANALOG INPUT 4
CONTROL 4
SUCCESSIVE APPROXIMATION
(NE5034, NE5037)
SUBSTRATE
D
0
D
7
A curve labeled “Aperture Time” has been included for sampling
conditions where the input is steady during the sampling period, but
may experience a sudden change nearly coincident with the “HOLD”
command. This curve is based on a 1mV error fed into the output.
A second curve, “Hold Settling Time,” indicates the time required for
the output to settle to 1mV after the “HOLD” command.
Digital Feedthrough
Fast rise time logic signals can cause hold errors by feeding
externally into the analog input at the same time the amplifier is put
into the hold mode. To minimize this problem, board layout should
keep logic lines as far as possible from the analog input. Grounded
guarding traces may also be used around the input line, especially if
it is driven from a high impedance source. Reducing high amplitude
logic signals to 2.5V will also help.
Logic signals also couple to the hold capacitor. This hold capacitor
should be guarded by a PC card trace connected to the
sample-and-hold output. This will also minimize board leakage.
SPECIAL NOTES
1. Not all definitions herein defined are measured parametrically for
the NE5537, but are legitimate terms used in sample-and-hold
systems.
2. Reference should be made to Design Engineering, Volumes 23
(Nov. 8, 1978), 25 (Dec. 6, 1978) and 26 (Dec. 20, 1978) for
articles written by Eugene Zuch of Datel Systems, Inc., for a
further discussion of sample-and-hold circuits.
3. Reference also made to National Semiconductor Corporation’s
Special Functions Data Book (1976).
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