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參數(shù)資料
| 型號(hào)： | SDC-14585-535Y |
| 廠商： | DATA DEVICE CORP |
| 元件分類(lèi)： | 位置變換器 |
| 英文描述： | SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, DIP36 |
| 封裝： | DDIP-36 |
| 文件頁(yè)數(shù)： | 9/18頁(yè) |
| 文件大?。?/td> | 202K |
| 代理商： | SDC-14585-535Y |
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Data Device Corporation
www.ddc-web.com
SDC-14580
H-05/04-0
ORDERING INFORMATION
SDC-1458X-XXXX
Supplemental Process Requirements:
S = Pre-Cap Source Inspection
L = 100% Pull Test
Q = 100% Pull Test and Pre-Cap Source Inspection
K = One Lot Date Code
W = One Lot Date Code and Pre-Cap Source Inspection
Y = One Lot Date Code and 100% Pull Test
Z = One Lot Date Code, Pre-Cap Source Inspection and 100% Pull Test
Blank = None of the Above
Accuracy:
2 = 4 minutes + 1 LSB
4 = 2 minutes + 1 LSB
5 = 1 minute + 1 LSB
Process Requirements:
0 = Standard DDC Processing, no Burn-In (See table below.)
1 = MIL-PRF-38534 Compliant
2 = B*
3 = MIL-PRF-38534 Compliant with PIND Testing
4 = MIL-PRF-38534 Compliant with Solder Dip
5 = MIL-PRF-38534 Compliant with PIND Testing and Solder Dip
6 = B* with PIND Testing
7 = B* with Solder Dip
8 = B* with PIND Testing and Solder Dip
9 = Standard DDC Processing with Solder Dip, no Burn-In (See table below.)
Temperature Grade/Data Requirements:
1 = -55°C to +125°C
2 = -40°C to +85°C
3 = 0°C to +70°C
4 = -55°C to +125°C with Variables Test Data
5 = -40°C to +85°C with Variables Test Data
8 = 0°C to +70°C with Variables Test Data
Configuration:
0 = 11.8V, Synchro
5 = 11.8V, Resolver
7 = 2 V, Direct Resolver
NOTES:
For 400 Hz and 60 Hz reference frequencies use the SDC-14560 Series converters.
Drawings to DESC format available from factory.
* Standard DDC Processing with burn-in and full temperature test—see table below.
TABLE 1
1015 (note 1), 1030 (note 2)
BURN-IN
Notes:
1. For Process Requirement "B*" (refer to ordering information), devices may be non-compliant with MIL-
STD-883, Test Method 1015, Paragraph 3.2. Contact factory for details.
2. When applicable.
3000g
2001
CONSTANT ACCELERATION
C
1010
TEMPERATURE CYCLE
A and C
1014
SEAL
—
2009, 2010, 2017, and 2032
INSPECTION
CONDITION(S)
METHOD(S)
MIL-STD-883
TEST
STANDARD DDC PROCESSING
FOR HYBRID AND MONOLITHIC HERMETIC PRODUCTS
相關(guān)PDF資料 |
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| SDC-14585-535Z | SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, DIP36 |
| SDC-14585-535 | SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, DIP36 |
| SDC-14585-542S | SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, DIP36 |
| SDC-14585-544S | SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, DIP36 |
| SDC-14585-544Y | SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, DIP36 |
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