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參數(shù)資料
| 型號： | SDC-14564-395 |
| 廠商： | DATA DEVICE CORP |
| 元件分類： | 位置變換器 |
| 英文描述： | SYNCHRO OR RESOLVER TO DIGITAL CONVERTER, DIP36 |
| 封裝： | 1.900 X 0.780 INCH, 0.210 INCH HEIGHT, DOUBLE WIDTH, KOVAR, DIP-36 |
| 文件頁數(shù)： | 3/12頁 |
| 文件大?。?/td> | 196K |
| 代理商： | SDC-14564-395 |
ORDERING INFORMATION
SDC-1456X-XXXX
Supplemental Process Requirements:
S = Pre-Cap Source Inspection
L = Pull Test
Q = Pull Test and Pre-Cap Inspection
K = One Lot Date Code
W = One Lot Date Code and PreCap Source
Y = One Lot Date Code and 100% Pull Test
Z = One Lot Date Code, PreCap Source and 100% Pull Test
Blank = None of the Above
Accuracy:
1 = 6 Minutes + 1 LSB
2 = 4 Minutes + 1 LSB
4 = 2 Minutes + 1 LSB
5 = 1 Minute + 1 LSB
Process Requirements:
0 = Standard DDC Processing, no Burn-In (See table below.)
1 = MIL-PRF-38534 Compliant
2 = B*
3 = MIL-PRF-38534 Compliant with PIND Testing
4 = MIL-PRF-38534 Compliant with Solder Dip
5 = MIL-PRF-38534 Compliant with PIND Testing and Solder Dip
6 = B* with PIND Testing
7 = B* with Solder Dip
8 = B* with PIND Testing and Solder Dip
9 = Standard DDC Processing with Solder Dip, no Burn-In (See table below.)
Temperature Grade/Data Requirements:
1 = -55°C to +125°C
2 = -40°C to +85°C
3 = 0°C to +70°C
4 = -55°C to +125°C with Variables Test Data
5 = -40°C to +85°C with Variables Test Data
8 = 0°C to +70°C with Variables Test Data
Configuration:
0 = 11.8 V, 400 Hz, Synchro
1 = 90 V, 400 Hz, Synchro
2 = 90 V, 60 Hz, Synchro
3 = 11.8 V, 400 Hz, Synchro, Hi Lin Velocity
4 = 26 V, 400 Hz, Resolver
5 = 11.8 V, 400 Hz, Resolver
6 = 11.8 V, 400 Hz, Resolver, Hi Lin Velocity
7 = 1 V, 400 Hz, Direct Resolver
8 = 1 V, 60 Hz, Direct Resolver
9 = 1 V, 400 Hz, Direct Resolver, Hi Lin Velocity
*Standard DDC Processing with burn-in and full temperature test — see table below.
Note: See next page for reference and signal transformer ordering information.
11
—
1015, Table 1
BURN-IN
A
2001
CONSTANT ACCELERATION
C
1010
TEMPERATURE CYCLE
A and C
1014
SEAL
—
2009, 2010, 2017, and 2032
INSPECTION
CONDITION(S)
METHOD(S)
TEST
MIL-STD-883
STANDARD DDC PROCESSING
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