參數(shù)資料
型號: SCAN90CP02VY
廠商: NATIONAL SEMICONDUCTOR CORP
元件分類: 運動控制電子
英文描述: Tape RoHS Compliant: Yes
中文描述: 2-CHANNEL, CROSS POINT SWITCH, PQFP32
封裝: PLASTIC, LQFP-32
文件頁數(shù): 10/12頁
文件大?。?/td> 261K
代理商: SCAN90CP02VY
Design-For-Test (DfT) Features
IEEE 1149.1 SUPPORT
The SCAN90CP02 supports a fully compliant IEEE 1149.1
interface. The Test Access Port (TAP) provides access to
boundary scan cells at each LVTTL I/O on the device for
interconnect testing. The TAP also provides access to the
IEEE 1149.6 test features if AC-coupled interconnects are
used.
Refer to the BSDL file located on National’s website for the
details of the SCAN90CP02 IEEE 1149.1 implementation.
IEEE 1149.6 SUPPORT
AC-coupled differential interconnections on very high speed
(1+ Gbps) data paths are not testable using traditional IEEE
1149.1 techniques. The IEEE 1149.1 structures and meth-
ods are intended to test static (DC-coupled), single ended
networks. It is unable to test dynamic (AC-coupled) digital
networks because the AC-coupling blocks static signals.
The SCAN90CP02 - which is intended for use in up to 1.5
Gbps data paths - has been designed with IEEE 1149.6
support to enable test of AC-coupled interconnects.
FAULT INSERTION
StuckAt is a feature that enables the user to override logic
values on any of the external pins during normal operation.
StuckAt can be thought of as having the same capabilities as
the IEEE-1149.1 EXTEST instruction but on a per pin bases.
Because this feature occurs on a per-pin basis, normal
device operation (mission mode) is possible with the excep-
tion of the desired faults.
For more information on any of these features, refer to
Application Note AN-1313, SCAN90CP02 Design-for-Test
Features.
S
www.national.com
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