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參數(shù)資料
型號： SC28L91A1B,528
廠商： NXP Semiconductors
文件頁數(shù)： 2/30頁
文件大?。?/td> 0K
描述： IC UART SINGLE W/FIFO 44PQFP
標(biāo)準(zhǔn)包裝： 1,500
系列： IMPACT
特點(diǎn)： 故障啟動(dòng)位檢測
通道數(shù)： 1，UART
FIFO's： 16 字節(jié)
電源電壓： 3.3V，5V
帶自動(dòng)流量控制功能： 是
帶故障啟動(dòng)位檢測功能： 是
帶調(diào)制解調(diào)器控制功能： 是
帶CMOS： 是
安裝類型： 表面貼裝
封裝/外殼： 44-QFP
供應(yīng)商設(shè)備封裝： 44-PQFP（10x10）
包裝： 帶卷 (TR)
其它名稱： 935267419528
SC28L91A1B-T
SC28L91A1B-T-ND
Philips Semiconductors
Product data sheet
SC28L91
3.3 V or 5.0 V Universal Asynchronous
Receiver/Transmitter (UART)
2004 Oct 21
10
ABSOLUTE MAXIMUM RATINGS1
Symbol
Parameter
Rating
Unit
Tamb
Operating ambient temperature range2
Note 4
°C
Tstg
Storage temperature range
–65 to +150
°C
VCC
Voltage from VCC to GND3
–0.5 to +7.0
V
VS
Voltage from any pin to GND3
–0.5 to VCC +0.5
V
PD
Package power dissipation (PLCC44)
2.4
W
PD
Package power dissipation (PQFP44)
1.78
W
Derating factor above 25
°C (PLCC44)
19
mW/
°C
Derating factor above 25
°C (PQFP44)
14
mW/
°C
NOTES:
1. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other condition above those indicated in the operation section of this specification is not
implied.
2. For operating at elevated temperatures, the device must be derated based on +150
°C maximum junction temperature.
3. This product includes circuitry specifically designed for the protection of its internal devices from damaging effects of excessive static
charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying any voltages larger than the rated maxima.
4. Parameters are valid over specified temperature and voltage range.
DC ELECTRICAL CHARACTERISTICS1, 2, 3
VCC = 5 V ± 10 %, Tamb = –40 °C to +85 °C, unless otherwise specified.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VIL
Input low voltage
0.8
V
VIH
Input high voltage (except X1/CLK)
2.4
1.5
V
VIH
Input high voltage (X1/CLK)
0.8VCC
2.4
V
VOL
Output low voltage
IOL = 2.4 mA
0.2
0.4
V
VOH
Output high voltage (except OD outputs)4
IOH = –400 A
VCC – 0.5
V
IIX1PD
X1/CLK input current - power down
VIN = 0 V to VCC
0.5
0.05
0.5
A
IILX1
X1/CLK input low current - operating
VIN = 0 V
–130
0
A
IIHX1
X1/CLK input high current - operating
VIN = VCC
0
130
A
Input leakage current:
II
All except input port pins
VIN = 0 V to VCC
–0.5
0.05
+0.5
A
Input port pins5
VIN = 0 V to VCC
–8
0.05
+0.5
A
IOZH
Output off current high, 3-State data bus
VIN = VCC
0.5
A
IOZL
Output off current low, 3-State data bus
VIN = 0 V
–0.5
A
IODL
Open-drain output low current in off-state
VIN = 0 V
–0.5
A
IODH
Open-drain output high current in off-state
VIN = VCC
0.5
A
Power supply current6
ICC
Operating mode
CMOS input levels
7
25
mA
Power down mode
CMOS input levels
≤1
5
mA
NOTES:
1. Parameters are valid over specified temperature and voltage range.
2. All voltage measurements are referenced to ground (GND). For testing, all inputs swing between 0.4 V and 3.0 V with a transition time of
5 ns maximum. For X1/CLK, this swing is between 0.4 V and 0.8VCC. All time measurements are referenced at input voltages of 0.8 V and
2.0 V and output voltages of 0.8 V and 2.0 V, as appropriate.
3. Typical values are at +25
°C, typical supply voltages, and typical processing parameters.
4. Test conditions for outputs: CL = 125 pF, except open drain outputs. Test conditions for open drain outputs: CL = 125 pF,
constant current source = 2.6 mA.
5. Input port pins have active pull-up transistors that will source a typical 2
A from VCC when the input pins are at VSS.
Input port pins at VCC source 0.0 A.
6. All outputs are disconnected. Inputs are switching between CMOS levels of VCC – 0.2 V and VSS + 0.2 V.
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