IRSTL 6) -100 – A
參數(shù)資料
型號(hào): SAF-C161K-LM 3V HA
廠商: Infineon Technologies
文件頁(yè)數(shù): 29/66頁(yè)
文件大?。?/td> 0K
描述: IC MCU 16BIT ROM/LESS MQFP-80-1
標(biāo)準(zhǔn)包裝: 1
系列: C16xx
核心處理器: C166
芯體尺寸: 16-位
速度: 20MHz
連通性: EBI/EMI,SPI,UART/USART
外圍設(shè)備: POR,PWM,WDT
輸入/輸出數(shù): 63
程序存儲(chǔ)器類(lèi)型: ROMless
RAM 容量: 1K x 8
電壓 - 電源 (Vcc/Vdd): 3 V ~ 3.6 V
振蕩器型: 外部
工作溫度: -40°C ~ 85°C
封裝/外殼: 80-QFP
包裝: 剪切帶 (CT)
其它名稱(chēng): SAF-C161K-LM3VHACT
SAF-C161K-LM3VHACT-ND
SAF-C161K-LM3VHAINCT
C161K
C161O
Data Sheet
31
V2.0, 2001-01
RSTIN active current4)
IRSTL
6)
-100
A
VIN = VIL
RD/WR inact. current7)
IRWH
-40
A
VOUT = 2.4 V
RD/WR active current7)
-500
A
VOUT = VOLmax
ALE inactive current7)
IALEL
40
A
VOUT = VOLmax
ALE active current7)
IALEH
500
A
VOUT = 2.4 V
Port 6 inactive current7)
IP6H
-40
A
VOUT = 2.4 V
Port 6 active current7)
IP6L
-500
A
VOUT = VOL1max
PORT0 configuration current7)
IP0H
-10
A
VIN = VIHmin
IP0L
-100
A
VIN = VILmax
XTAL1 input current
IIL
CC
±20
A0 V < V
IN < VDD
Pin capacitance8)
(digital inputs/outputs)
CIO CC –
10
pF
f = 1 MHz
TA = 25 °C
1) Keeping signal levels within the levels specified in this table, ensures operation without overload conditions.
For signal levels outside these specifications also refer to the specification of the overload current
IOV.
2) Valid in bidirectional reset mode only.
3) This specification is not valid for outputs which are switched to open drain mode. In this case the respective
output will float and the voltage results from the external circuitry.
4) These parameters describe the RSTIN pullup, which equals a resistance of ca. 50 to 250 k
.
5) The maximum current may be drawn while the respective signal line remains inactive.
6) The minimum current must be drawn in order to drive the respective signal line active.
7) This specification is valid during Reset and during Adapt-mode.
8) Not 100% tested, guaranteed by design and characterization.
DC Characteristics (Standard Supply Voltage Range) (cont’d)
(Operating Conditions apply)1)
Parameter
Symbol
Limit Values
Unit Test Condition
min.
max.
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