
Appendix A Electrical Characteristics
MC9S12HZ256 Data Sheet, Rev. 2.05
630
Freescale Semiconductor
A.1.10
Supply Currents
This section describes the current consumption characteristics of the device as well as the conditions for
the measurements.
A.1.10.1
Measurement Conditions
All measurements are without output loads. Unless otherwise noted the currents are measured in single
chip mode, internal voltage regulator enabled and at 16MHz bus frequency using a 4MHz oscillator in
Colpitts mode. Production testing is performed using a square wave signal at the EXTAL input.
A.1.10.2
Additional Remarks
In expanded modes the currents owing in the system are highly dependent on the load at the address, data
and control signals as well as on the duty cycle of those signals. No generally applicable numbers can be
given. A very good estimate is to take the single chip currents and add the currents due to the external loads.
15
P Internal Pull Down Device Current,
tested at V
IL
Max.
IPDL
10
–
A
16
D Input Capacitance
Cin
6–
pF
17
T Injection current3
Single Pin limit
Total Device Limit. Sum of all injected currents
IICS
IICP
–2.5
–25
–
2.5
25
mA
18
P Port AD Interrupt Input Pulse ltered4
tPULSE
3
s
19
P Port AD Interrupt Input Pulse passed
4tPULSE
10
s
1 Maximum leakage current occurs at maximum operating temperature. Current decreases by approximately one-half for each
8 C to 12 C in the temper
ature range from 50 C to 125 C
.
2 Maximum leakage current occurs at maximum operating temperature. Current decreases by approximately one-half for each
8 C to 12 C in the temper
ature range from 50 C to 125 C
.
4 Parameter only applies in STOP or Pseudo STOP mode.
Table A-6. 5V I/O Characteristics
Conditions are shown in Table A-4 unless otherwise noted