參數(shù)資料
型號: S3F49FAX
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: S3F49FAX for Compact Flash SPECIFICATION Revision 1.0
中文描述: S3F49FAX的閃存規(guī)范修訂版1.0
文件頁數(shù): 20/27頁
文件大?。?/td> 296K
代理商: S3F49FAX
SPECIFICATION
S3F49FAX
19
Table 5. Signal Description for Miscellaneous Part
Signal Name
100-Pin Number
I/O
Description
TCK
17
I
TEST CLOCK:
The S3F49FAX contains internally in-circuit emulation block
for debugger mode which use standard JTAG protocol.
When the controller go into debugger mode, this signal is
provided from external debugger tool.
TEST MODE SELECT:
In the debugger mode, this signal select test mode. This pin
should be held to “1’, when do not use the JTAG block.
TEST DATA INPUT:
In the debugger mode, this signal is used for carry data.
from external debugger tool to the controller.
TEST RESET:
This signal should be sustained LOW first at the begging of
normal operation.
TEST DATA OUTPUT:
In the debugger mode, this signal is used for carry data.
from the controller to external debugger tool.
INPUT CLOCK:
This signal is system clock.
OUTPUT CLOCK:
This signal is system output clock.
TMS
16
I
TDI
15
I
TRST
14
I
TDO
20
O
XI
21
XO
22
TEST0
TEST1
TEST2
RSOUT
CKOUT
HWP
31
32
33
25
24
23
I
SELECT TEST MODE:
Select the test mode of chip
I/O
I/O
I
Output Internal Reset Signal
Output the PLL clock signal for checking PLL operation
Protect writing/erasing operation
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相關(guān)代理商/技術(shù)參數(shù)
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S3F49FAXZA 制造商:SAMSUNG 制造商全稱:Samsung semiconductor 功能描述:S3F49FAX for Compact Flash SPECIFICATION Revision 1.0
S3F49FAXZZ 制造商:SAMSUNG 制造商全稱:Samsung semiconductor 功能描述:S3F49FAX for Compact Flash SPECIFICATION Revision 1.0
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