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    參數(shù)資料
    型號(hào): S29GL128P11FFIV13
    廠商: SPANSION LLC
    元件分類: PROM
    英文描述: 3.0 Volt-only Page Mode Flash Memory featuring 90 nm MirrorBit Process Technology
    中文描述: 128M X 1 FLASH 3V PROM, 110 ns, PBGA64
    封裝: 13 X 11 MM, 1 MM PITCH, LEAD FREE, FBGA-64
    文件頁數(shù): 62/71頁
    文件大小: 990K
    代理商: S29GL128P11FFIV13
    60
    S29GL-P MirrorBit
    TM
    Flash Family
    S29GL-P_00_A3 November21,2006
    D a t a
    S h e e t
    ( A d v a n c e
    I n f o r m a t i o n )
    11.7.5
    Erase And Programming Performance
    Notes
    1. Typical program and erase times assume the following conditions: 25°C, 3.6 V V
    CC
    , 10,000 cycles, checkerboard pattern.
    2. Under worst case conditions of -40°C, V
    CC
    = 3.0 V, 100,000 cycles.
    3. Effective write buffer specification is based upon a 32-word write buffer operation.
    4. The typical chip programming time is considerably less than the maximum chip programming time listed, since most words program faster than the maximum
    program times listed.
    5. In the pre-programming step of the Embedded Erase algorithm, all bits are programmed to 00h before erasure.
    6. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command.
    See Tables
    12.1
    12.4
    .
    11.7.6
    TSOP Pin and BGA Package Capacitance
    Notes
    1. Sampled, not 100% tested.
    2. Test conditions T
    A
    = 25°C, f = 1.0 MHz.
    Table 11.8
    Erase And Programming Performance
    Parameter
    Typ
    (Note 1)
    Max
    (Note 2)
    Unit
    Comments
    Sector Erase Time
    0.5
    3.5
    sec
    Excludes 00h programming
    prior to erasure
    (Note 5)
    Chip Erase Time
    S29GL128P
    64
    256
    sec
    S29GL256P
    128
    512
    S29GL512P
    256
    1024
    S29GL01GP
    512
    2048
    Total Write Buffer Time
    (Note 3)
    480
    μs
    Excludes system level
    overhead
    (Note 6)
    Total Accelerated Write Buffer Programming Time
    (Note 3)
    432
    μs
    Chip Program Time
    (Note 4)
    S29GL128P
    123
    sec
    S29GL256P
    246
    S29GL512P
    492
    S29GL01GP
    984
    Table 1:
    Parameter Symbol
    Parameter Description
    Test Setup
    Typ
    Max
    Unit
    C
    IN
    Input Capacitance
    V
    IN
    = 0
    TSOP
    6
    7.5
    pF
    BGA
    4.2
    5.0
    pF
    C
    OUT
    Output Capacitance
    V
    OUT
    = 0
    TSOP
    8.5
    12
    pF
    BGA
    5.4
    6.5
    pF
    C
    IN2
    Control Pin Capacitance
    V
    IN
    = 0
    TSOP
    7.5
    9
    pF
    BGA
    3.9
    4.7
    pF
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