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    參數(shù)資料
    型號: S29GL064M90TCIR13
    廠商: SPANSION LLC
    元件分類: DRAM
    英文描述: 256,128,64,32,Megabit 3.0 Volt-only Page Mode Flash Memory featuring 0.23 レm MirrorBit Process Technology
    中文描述: 4M X 16 FLASH 3V PROM, 90 ns, PDSO48
    封裝: LEAD FREE, TSOP-48
    文件頁數(shù): 25/116頁
    文件大小: 1656K
    代理商: S29GL064M90TCIR13
    October 10, 2006 S29GL-M_00_B6
    S29GL-M MirrorBit
    TM
    Flash Family
    23
    D a t a S h e e t
    The internal state machine is set for reading array data upon device power-up, or after a hardware
    reset. This ensures that no spurious alteration of the memory content occurs during the power
    transition. No command is necessary in this mode to obtain array data. Standard microprocessor
    read cycles that assert valid addresses on the device address inputs produce valid data on the
    device data outputs. The device remains enabled for read access until the command register con-
    tents are altered.
    See
    Reading Array Data
    for more information. See
    AC Characteristics
    for timing specifications and
    the timing diagram. See
    DC Characteristics
    for the active current specification on reading array
    data.
    Page Mode Read
    The device is capable of fast page mode read and is compatible with the page mode Mask ROM
    read operation. This mode provides faster read access speed for random locations within a page.
    The page size of the device is 4 words/8 bytes. The appropriate page is selected by the higher
    address bits A(max)–A2. Address bits A1–A0 in word mode (A1–A-1 in byte mode) determine the
    specific word within a page. This is an asynchronous operation; the microprocessor supplies the
    specific word location.
    The random or initial page access is equal to t
    ACC
    or t
    CE
    and subsequent page read accesses (as
    long as the locations specified by the microprocessor falls within that page) is equivalent to t
    PACC
    .
    When CE# is deasserted and reasserted for a subsequent access, the access time is t
    ACC
    or t
    CE
    .
    Fast page mode accesses are obtained by keeping the “read-page addresses” constant and
    changing the “intra-read page” addresses.
    Writing Commands/Command Sequences
    To write a command or command sequence (which includes programming data to the device and
    erasing sectors of memory), the system must drive WE# and CE# to V
    IL
    , and OE# to V
    IH
    .
    The device features an
    Unlock Bypass
    mode to facilitate faster programming. Once the device
    enters the Unlock Bypass mode, only two write cycles are required to program a word, instead of
    four.
    Word Program Command Sequence
    contains details on programming data to the device
    using both standard and Unlock Bypass command sequences.
    An erase operation can erase one sector, multiple sectors, or the entire device.
    Table 6
    and
    Table 16
    indicates the address space that each sector occupies.
    See
    DC Characteristics
    for the active current specification for the write mode.
    AC Characteristics
    contains timing specification tables and timing diagrams for write operations.
    W rite Buffer
    Write Buffer Programming allows the system write to a maximum of 16 words/32 bytes in one
    programming operation. This results in faster effective programming time than the standard pro-
    gramming algorithms. See
    Write Buffer Programming
    for more information.
    Accelerated Program Operation
    The device offers accelerated program operations through the ACC function. This is one of two
    functions provided by the WP#/ACC or ACC pin, depending on model number. This function is pri-
    marily intended to allow faster manufacturing throughput at the factory.
    If the system asserts V
    HH
    on this pin, the device automatically enters the aforementioned Unlock
    Bypass mode, temporarily unprotects any protected sector groups, and uses the higher voltage
    on the pin to reduce the time required for program operations. The system would use a two-cycle
    program command sequence as required by the Unlock Bypass mode. Removing V
    HH
    from the
    WP#/ACC or ACC pin, depending on model number, returns the device to normal operation.
    Note
    that the WP#/ACC or ACC pin must not be at V
    HH
    for operations other than accelerated program-
    ming, or device damage may result. WP# has an internal pullup; when unconnected, WP# is at
    V
    IH
    .
    Autoselect Functions
    If the system writes the autoselect command sequence, the device enters the autoselect mode.
    The system can then read autoselect codes from the internal register (which is separate from the
    memory array) on DQ7–DQ0. Standard read cycle timings apply in this mode. See
    Autoselect
    Mode
    and
    Autoselect Command Sequence
    for more information.
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