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參數(shù)資料
| 型號(hào)： | QW0905-LUR3333H |
| 廠商： | Electronic Theatre Controls, Inc. |
| 英文描述： | SUPER BRIGHT ROUND TYPE LED LAMPS |
| 中文描述： | 超亮圓形LED節(jié)能燈 |
| 文件頁(yè)數(shù)： | 5/5頁(yè) |
| 文件大小： | 77K |
| 代理商： | QW0905-LUR3333H |
This test intended to see soldering well
performed or not.
The purpose of this test is the resistance
of the device under tropical for hous.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
Solderability Test
1.T.Sol=230
2.Dwell time=5 1sec
5
High Temperature
High Humidity Test
Thermal Shock Test
Solder Resistance
Test
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
1.Ta=105
(10min) (10min)
2.total 10 cycles
5
&-40
5
1.T.Sol=260
2.Dwell time= 10 1sec.
5
1.Ta=65
2.RH=90%~95%
3.t=240hrs 2hrs
5
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
MIL-STD-202:103B
JIS C 7021: B-11
This test is conducted for the purpose
of detemining the resisance of a part
in electrical and themal stressed.
Operating Life Test
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
High Temperature
Storage Test
Low Temperature
Storage Test
The purpose of this is the resistance of
the device which is laid under ondition
of high temperature for hours.
1.Ta=-40
2.t=1000 hrs (-24hrs, +72hrs)
5
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
1.Ta=105
2.t=1000 hrs (-24hrs, +72hrs)
5
Reliability Test:
Test Item
Test Condition
Description
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
JIS C 7021: B-12
MIL-STD-883:1008
JIS C 7021: B-10
Reference
Standard
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
4/4
Page
PART NO. LUR3333H
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