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    參數(shù)資料
    型號: QT66-HC-D-5-36.000MHZ
    廠商: Q-TECH CORP
    元件分類: XO, clock
    英文描述: CRYSTAL OSCILLATOR, CLOCK, 36 MHz, HCMOS OUTPUT
    封裝: ROHS COMPLIANT, HERMETIC SEALED, LEADLESS, CERAMIC, SMD, 40 PIN
    文件頁數(shù): 5/6頁
    文件大?。?/td> 494K
    代理商: QT66-HC-D-5-36.000MHZ
    55
    Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
    Q-TECH
    CORPORATION
    LEADLESS CHIP CARRIER
    CRYSTAL CLOCK OSCILLATORS
    1.8 to 15Vdc - 732.4Hz to 125MHz
    LeadlessChipCarrier (RevisionD,August2008)(ECO#9414)
    45
    Hybrid Case
    Substrate
    Die
    D/A epoxy
    Heat
    Die
    R1
    D/A epoxy
    Substrate
    D/A epoxy
    Hybrid Case
    R2
    R3
    R4
    R5
    ThermalCharacteristics
    JA
    JC
    CA
    Die
    T
    C
    A
    J
    CA
    JC
    (Figure1)
    (Figure2)
    Theheattransfermodelinahybridpackageisdescribedin
    figure1.
    Heatspreadingoccurswhenheatflowsintoamateriallayerof
    increasedcross-sectionalarea. Itisadequatetoassumethat
    spreadingoccursata45°angle.
    Thetotalthermalresistanceiscalculatedbysummingthe
    thermalresistancesofeachmaterialinthethermalpath
    betweenthedeviceandhybridcase.
    RT=R1+R2+R3+R4+R5
    ThetotalthermalresistanceRT(seefigure2)betweentheheat
    source(die)tothehybridcaseistheThetaJunctiontoCase
    (ThetaJC)in°C/W.
    Thetajunctiontocase(ThetaJC)forthisproductis30°C/W.
    Thetacasetoambient(ThetaCA)forthispartis100°C/W.
    ThetaJunctiontoambient(ThetaJA)is130°C/W.
    MaximumpowerdissipationPDforthispackageat25°Cis:
    PD(max)=(TJ(max)–TA)/ThetaJA
    WithTJ=175°C(Maximumjunctiontemperatureofdie)
    PD(max)=(175–25)/130=1.15W
    EnvironmentalSpecifications
    Q-TechStandardScreening/QCI(MIL-PRF55310)isavailableforallofourLeadlessChipCarrierpackages. Q-Techcanalso
    customizescreeningandtestprocedurestomeetyourspecificrequirements. TheLeadlessChipCarrierpackagesaredesignedand
    processedtoexceedthefollowingtestconditions:
    EnvironmentalTest
    TestConditions
    Temperaturecycling
    MIL-STD-883,Method1010,Cond.B
    Constantacceleration
    MIL-STD-883,Method2001,Cond.A,Y1
    SealFineLeak
    MIL-STD-883,Method1014,Cond.A
    Burn-in
    160hours,125°Cwithload
    Aging
    30days,70°C,±1.5ppmmax
    Vibrationsinusoidal
    MIL-STD-202,Method204,Cond.D
    Shock,nonoperating
    MIL-STD-202,Method213,Cond.I
    Thermalshock,nonoperating
    MIL-STD-202,Method107,Cond.B
    Ambientpressure,nonoperating
    MIL-STD-202,105,Cond.C,5minutesdwelltimeminimum
    Resistancetosolderheat
    MIL-STD-202,Method210,Cond.B
    Moistureresistance
    MIL-STD-202,Method106
    Terminalstrength
    MIL-STD-202,Method211,Cond.C
    Resistancetosolvents
    MIL-STD-202,Method215
    Solderability
    MIL-STD-202,Method208
    PleasecontactQ-Techforhighershockrequirements
    相關(guān)PDF資料
    PDF描述
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