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1
SCOPE
1.1
Scope. This specification establishes the detail requirements for hybrid, hermetically sealed, CMOS
output temperature compensated crystal oscillators for use in space flight missions.
1.2
Part number. The part number shall be as specified in Table I herein.
2
APPLICABLE DOCUMENTS
2.1
Specifications and standards. Unless otherwise specified, the following documents shall be applicable
to this specification to the extent specified herein.
SPECIFICATIONS
401-0298-017
Hybrid Crystal Oscillators, TCXO, Class S, General Specification For
3
REQUIREMENTS
3.1
General requirements. The individual item requirements shall be as specified in the General
Specification with the exceptions, modifications, and additions specified herein.
3.2
Design and construction
3.2.1.
Outline dimensions and terminal connections. The outline dimensions and terminal connections shall
be as shown in Figure 1 and 2 herein.
3.2.2.
Package body and lead finish. The package body and lead finish shall be gold in accordance with
MIL-PRF-38534.
3.2.3.
Active Devices. For output frequencies greater than 10 MHZ, the CMOS micorcircuit used in this part
shall be National Semiconductor Corporation (NSC) 54AC00 from a wafer proven to be radiation
tolerant to 100 kRad (Si) total ionizing dose. This device is specified to be single event latchup free
(see DSSC SMD 5962-87549) for LET up to 93 MeV-cm2/mg.
For lower frequencies the CMOS
microcircuit shall be Intersil Corporation 54ACS family, Silicon on Sapphire technology, from a wafer
proven to be radiation tolerant to 300 kRad (Si).
3.3
Performance requirements
3.3.1.
Maximum ratings. The maximum ratings shall be as specified in Table II herein.
3.3.2.
Electrical performance characteristics and limits. The electrical performance requirements and limits
shall be in accordance with Table III.
3.3.3.
Delta limits. Except for frequency aging (refer to Table III herein), delta limits shall be in accordance
with the General Specification.
3.3.4.
Total dose radiation limits. Hybrid crystal oscillators supplied in accordance with this specification shall
be capable of meeting the performance requirements after being exposed to 100 krad total dose
radiation levels.
4
QUALITY ASSURANCE PROVISIONS
4.1
General. The quality assurance provisions shall be in accordance with the General Specification with
the exceptions, modifications, and additions specified herein.
4.2
Screening tests. The screening tests shall be in accordance with the General Specification.
4.2.1.
Frequency-Temperature Stability (tolerance) test method. Devices shall be trimmed via adjustment of
external resistor to ground, pin 1, for frequency accuracy at T = 25 C during pre Burn-in and Group A
Electrical test (prior to temperature sweep). Value shall be recorded as part of the test data. Table III
GENERAL RELEASE DOCUMENT.
CONSULT FACTORY FOR CURRENT REVISION.
Q-TECH CORPORATION
10150 W. Jefferson Blvd.
Culver City, CA. 90232
Specification: QT601S, Rev -
Sheet 2 of 5