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參數(shù)資料
| 型號： | QT278L-D-14-B-FREQ3 |
| 廠商： | Q-TECH CORP |
| 元件分類： | XO, clock |
| 英文描述： | CRYSTAL OSCILLATOR, CLOCK, 50 MHz - 70 MHz, LVHCMOS OUTPUT |
| 封裝： | ROHS COMPLIANT, HERMETIC SEALED, CERAMIC, SMD, 4 PIN |
| 文件頁數(shù)： | 4/7頁 |
| 文件大小： | 710K |
| 代理商： | QT278L-D-14-B-FREQ3 |
44
Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
CLASS B+ PRODUCTS
CRYSTAL CLOCK OSCILLATORS
3.3 to 5.0Vdc
-
450kHz to 85MHz
ClassB+Products(Revision-,April2009)
Q-TECH
CORPORATION
SCREENING
TESTDESCRIPTION
STANDARD METHOD CONDITION QUANTITY
COMMENTS
Blank M B S
Nondestructivebondpull
883
2023
100%
2.4grams
Internalvisual
883
2017
ClassH
100%
Stabilizationbake
883
1008
C
100%
48hoursat150'C
Temperaturecycling
883
1010
B(forM)
C(forB&S)
100%
10cycles
Constantacceleration
883
2001
A
100%
Y1directiononly
Particleimpactnoisedetection(PIND)
883
2020
B
100%
5passesminimum
(seenote1)
Preburn-inelectrical
RefertoTableIanddetailspecification
100%
Burn-in#1
883
1015 125°Cfor160hours 100%
(seenote2)
Interimelectrical
RefertoTableI,IIanddetailspecification
100%
Burn-in#2
883
1015 125°Cfor160hours 100%
(seenote2)
Finalelectrical
Refertodetailspecification...................(forBlank)
RefertoTableIanddetailspecification.......(forM)
RefertoTableIanddetailspecification.......(forB)
RefertoTableI,IIanddetailspecification...(forS)
100%
Seal:Fineleak
883
1014
A1
100%
Seal:Grossleak
883
1014
C
100%
Radiographicinspection
883
2012
ClassS
100%
Frequencyaging30days
MIL-PRF-55310 -
70°C
100%
±1.5ppmmax.
(seenote3)
Frequency/Temperaturestability MIL-PRF-55310
Measuretheoutputfrequencyattenequispacedpoints
minimumofthespecifiedoperatingtemperaturerange
Externalvisual
883
2009
100%
Parameters
PreBIat25C PreBILowT PreBIHighT InterimBIat25C PostBIat25C PostBILowT PostBIHighT
M B S M B S M B S M B S M B S M B S M B S
Outputfrequency
Frequency/temperaturestability
Frequency/voltagestability
Inputcurrent
Outputvoltage
Waveform
Dutycycle(symmetry)
Riseandfalltimes
Startuptime
Test
Parameter
Symbol
DeltaLimits
Burn-In(second160hoursBurn-Inperiod)
Supplycurrent
Icc
±10%ofinitialreading
Frequencyagingafter30daysat+70°C
OutputFrequency
Fo
Refertodetailspec.
ScreeningTestTable
TableIElectricalTest-MeasurementRequirements(ApplicabletoscreeninglevelM,B,&Sonly)
TableIIDeltaLimits(ApplicabletoscreeninglevelSonly)
1. PINDtestingshallbeperformedusingfive(5)independentpassesandallfailuresfoundattheendofeachpassarerejected.Thesurvivorsofthe
lastpassareacceptable.
2. Burn-inshallbeunderthespecifiedloadandnominalvoltageconditions.
3. Normally,frequencyagingtestsarefor30days.However,thefrequencyagingtestmaybeceasedifafter15daysthemeasuredagingrateisless
thanhalfofthespecifiedagingrate.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| QT88AC-14-M-FREQ3 | CRYSTAL OSCILLATOR, CLOCK, 60 MHz - 85 MHz, ACMOS/TTL OUTPUT |
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| QT88AC-D-10-M-FREQ1 | CRYSTAL OSCILLATOR, CLOCK, 0.5 MHz - 15 MHz, ACMOS/TTL OUTPUT |
| QT278L-D-9-M-0.450MHZ | CRYSTAL OSCILLATOR, CLOCK, 0.45 MHz, LVHCMOS OUTPUT |
| QT278T-1-M-FREQ2 | CRYSTAL OSCILLATOR, CLOCK, 15 MHz - 60 MHz, TTL OUTPUT |
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