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參數資料
| 型號： | PZ5128CS7BP-S |
| 英文描述： | Electrically-Erasable Complex PLD |
| 中文描述： | 電可擦除復雜可編程邏輯器件 |
| 文件頁數： | 12/22頁 |
| 文件大小： | 180K |
| 代理商： | PZ5128CS7BP-S |
Philips Semiconductors
Product specification
PZ5128
128 macrocell CPLD
1997 Aug 12
12
1. Specifications measured with one output switching. See Figure 6 and Table 8 for derating.
2. This parameter guaranteed by design and characterization, not by test.
3. Output C
L
= 5pF.
DC ELECTRICAL CHARACTERISTICS FOR INDUSTRIAL GRADE DEVICES
Industrial:
–40
°
C
≤
T
amb
≤
+85
°
C; 4.5V
≤
V
DD
≤
5.5V
SYMBOL
PARAMETER
V
IL
Input voltage low
V
IH
Input voltage high
V
I
Input clamp voltage
V
OL
Output voltage low
V
OH
Output voltage high
I
I
Input leakage current
I
OZ
3-Stated output leakage current
I
DDQ
Standby current
TEST CONDITIONS
V
DD
= 4.5V
V
DD
= 5.5V
V
DD
= 4.5V, I
IN
= –18mA
V
DD
= 4.5V, I
OL
= 12mA
V
DD
= 4.5V, I
OH
= –12mA
V
IN
= 0 to V
DD
V
IN
= 0 to V
DD
V
DD
= 5.5V, T
amb
= –40
°
C
V
DD
= 5.5V, T
amb
= –40
°
C @ 1MHz
V
DD
= 5.5V, T
amb
= –40
°
C @ 50MHz
1 pin at a time for no longer than 1 second
T
amb
= 25
°
C, f = 1MHz
T
amb
= 25
°
C, f = 1MHz
T
amb
= 25
°
C, f = 1MHz
MIN.
MAX.
0.8
UNIT
V
V
V
V
V
μ
A
μ
A
μ
A
mA
mA
mA
pF
pF
pF
2.0
–1.2
0.5
2.4
–10
–10
10
10
125
6
90
–230
8
12
10
I
DDD1
Dynamic current
I
OS
C
IN
C
CLK
C
I/O
Short circuit output current
2
Input pin capacitance
2
Clock input capacitance
2
I/O pin capacitance
2
–50
5
NOTES:
1. This parameter measured with a 16–bit, loadable up/down counter loaded into every logic block, with all outputs disabled and unloaded.
Inputs are tied to V
DD
or ground. This parameter guaranteed by design and characterization, not testing.
2. Typical values, not tested.
AC ELECTRICAL CHARACTERISTICS FOR INDUSTRIAL GRADE DEVICES
Industrial:
–40
°
C
≤
T
amb
≤
+85
°
C; 4.5V
≤
V
DD
≤
5.5V
SYMBOL
PARAMETER
I10
I15
UNIT
MIN.
2
3
2
8
10
MAX.
10
12
7
MIN.
2
3
2
8
10.5
MAX.
15
17.5
8
t
PD_PAL
t
PD_PLA
t
CO
t
SU_PAL
t
SU_PLA
t
H
t
CH
t
CL
t
R
t
F
f
MAX1
f
MAX2
f
MAX3
t
BUF
t
PDF_PAL
t
PDF_PLA
t
CF
t
INIT
t
ER
t
EA
t
RP
t
RR
NOTES:
1. Specifications measured with one output switching. See Figure 6 and Table 8 for derating.
2. This parameter guaranteed by design and characterization, not by test.
3. Output C
L
= 5pF.
Propagation delay time, input (or feedback node) to output through PAL
Propagation delay time, input (or feedback node) to output through PAL & PLA
Clock to out delay time
Setup time (from input or feedback node) through PAL
Setup time (from input or feedback node) through PAL + PLA
Hold time
Clock High time
Clock Low time
Input Rise time
Input Fall time
Maximum FF toggle rate
2
1/(t
CH
+ t
CL
)
Maximum internal frequency
2
1/(t
SUPAL
+ t
CF
)
Maximum external frequency
2
1/(t
SUPAL
+ t
CO
)
Output buffer delay time
Input (or feedback node) to internal feedback node delay time through PAL
Input (or feedback node) to internal feedback node delay time through PAL+PLA
Clock to internal feedback node delay time
Delay from valid V
DD
to valid reset
Input to output disable
3
Input to output valid
Input to register preset
Input to register reset
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
MHz
MHz
MHz
ns
ns
ns
ns
μ
s
ns
ns
ns
ns
0
0
5
5
5
5
20
20
20
20
100
71
66
100
69
63
1.5
8.5
10.5
6
50
15
15
15
15
1.5
13.5
16
6.5
50
15
15
17
17
2
3
2
3
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