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| 型號(hào)： | PLUS173D |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Programmable logic arrays 22 】 42 】 10 |
| 中文描述： | 可編程邏輯陣列22】42】10 |
| 文件頁數(shù)： | 4/8頁 |
| 文件大小： | 73K |
| 代理商： | PLUS173D |
Philips Semiconductors Programmable Logic Devices
Product specification
PLUS173B/D
Programmable logic arrays
(22
×
42
×
10)
October 22, 1993
36
DC ELECTRICAL CHARACTERISTICS
0
°
C
≤
T
amb
≤
+75
°
C, 4.75
≤
V
CC
≤
5.25V
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
TYP
1
MAX
UNIT
Input voltage
2
V
IL
Low
V
CC
= MIN
0.8
V
V
IH
High
V
CC
= MAX
2.0
V
V
IC
Output voltage
2
Clamp
V
CC
= MIN, I
IN
= –12mA
–0.8
–1.2
V
V
CC
= MIN
V
OL
Low
4
I
OL
= 15mA
0.5
V
V
OH
Input current
9
High
5
I
OH
= –2mA
2.4
V
V
CC
= MAX
I
IL
Low
V
IN
= 0.45V
–100
μ
A
I
IH
High
V
IN
= V
CC
40
μ
A
Output current
V
CC
= MAX
I
O(OFF)
Hi-Z state
8
V
OUT
= 2.7V
80
μ
A
V
OUT
= 0.45V
–140
I
OS
Short circuit
3, 5, 6
V
OUT
= 0V
–15
–70
mA
I
CC
V
CC
supply current
7
V
CC
= MAX
150
200
mA
Capacitance
V
CC
= 5V
I
IN
Input
V
IN
= 2.0V
8
pF
C
B
I/O
V
B
= 2.0V
15
pF
NOTES:
1. All typical values are at V
= 5V, T
= +25
°
C.
2. All voltage values are with respect to network ground terminal.
3. Test one at a time.
4. Measured with inputs I0 – I4 = 0V, inputs I5 – I9 = 4.5V, I11 = 4.5V and I19 = 10V. For outputs B0 – B4 and for outputs B5 – B9 apply the
same conditions except I11 = 0V.
5. Same conditions as Note 4 except input I11 = +10V.
6. Duration of short circuit should not exceed 1 second.
7. I
CC
is measured with inputs I0 – I11 and B0 – B9 = 0V. Part in Virgin State.
8. Leakage values are a combination of input and output leakage.
9. I
IL
and I
IH
limits are for dedicated inputs only (I0 – I11).
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