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| 型號： | PK40X256VMD100 |
| 廠商： | Freescale Semiconductor |
| 文件頁數(shù)： | 30/78頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC ARM CORTEX MCU 256K 144-MAP |
| 產(chǎn)品培訓(xùn)模塊： | Kinetis® Cortex-M4 Microcontroller Family |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 系列： | Kinetis |
| 核心處理器： | ARM? Cortex?-M4 |
| 芯體尺寸： | 32-位 |
| 速度： | 100MHz |
| 連通性： | CAN，EBI/EMI，I²C，IrDA，SDHC，SPI，UART/USART，USB，USB OTG |
| 外圍設(shè)備： | DMA，I²S，LCD，LVD，POR，PWM，WDT |
| 輸入/輸出數(shù)： | 98 |
| 程序存儲器容量： | 256KB（256K x 8） |
| 程序存儲器類型： | 閃存 |
| EEPROM 大?。?/td> | 4K x 8 |
| RAM 容量： | 64K x 8 |
| 電壓 - 電源 (Vcc/Vdd)： | 1.71 V ~ 3.6 V |
| 數(shù)據(jù)轉(zhuǎn)換器： | A/D 33x16b，D/A 2x12b |
| 振蕩器型： | 內(nèi)部 |
| 工作溫度： | -40°C ~ 105°C |
| 封裝/外殼： | 144-LBGA |
| 包裝： | 托盤 |
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Table 23. NVM reliability specifications (continued)
Symbol
Description
Min.
Typ.1
Max.
Unit
Notes
tnvmretd1k Data retention after up to 1 K cycles
20
100
—
years
nnvmcycd Cycling endurance
10 K
50 K
—
cycles
FlexRAM as EEPROM
tnvmretee100 Data retention up to 100% of write endurance
5
50
—
years
tnvmretee10 Data retention up to 10% of write endurance
20
100
—
years
nnvmwree16
nnvmwree128
nnvmwree512
nnvmwree4k
nnvmwree32k
Write endurance
EEPROM backup to FlexRAM ratio = 16
EEPROM backup to FlexRAM ratio = 128
EEPROM backup to FlexRAM ratio = 512
EEPROM backup to FlexRAM ratio = 4096
EEPROM backup to FlexRAM ratio =
32,768
35 K
315 K
1.27 M
10 M
80 M
175 K
1.6 M
6.4 M
50 M
400 M
—
writes
1. Typical data retention values are based on measured response accelerated at high temperature and derated to a constant
25°C use profile. Engineering Bulletin EB618 does not apply to this technology. Typical endurance defined in Engineering
Bulletin EB619.
2. Cycling endurance represents number of program/erase cycles at -40°C ≤ Tj ≤ 125°C.
3. Write endurance represents the number of writes to each FlexRAM location at -40°C ≤Tj ≤ 125°C influenced by the cycling
endurance of the FlexNVM (same value as data flash) and the allocated EEPROM backup per subsystem. Minimum and
typical values assume all byte-writes to FlexRAM.
6.4.1.5 Write endurance to FlexRAM for EEPROM
When the FlexNVM partition code is not set to full data flash, the EEPROM data set size
can be set to any of several non-zero values.
The bytes not assigned to data flash via the FlexNVM partition code are used by the flash
memory module to obtain an effective endurance increase for the EEPROM data. The
built-in EEPROM record management system raises the number of program/erase cycles
that can be attained prior to device wear-out by cycling the EEPROM data through a
larger EEPROM NVM storage space.
While different partitions of the FlexNVM are available, the intention is that a single
choice for the FlexNVM partition code and EEPROM data set size is used throughout the
entire lifetime of a given application. The EEPROM endurance equation and graph
shown below assume that only one configuration is ever used.
Writes_subsystem =
× Write_efficiency × n
EEPROM – 2 × EEESPLIT × EEESIZE
EEESPLIT × EEESIZE
nvmcycd
where
Writes_subsystem — minimum number of writes to each FlexRAM location for
subsystem (each subsystem can have different endurance)
Peripheral operating requirements and behaviors
K40 Sub-Family Data Sheet Data Sheet, Rev. 7, 02/2013.
36
Freescale Semiconductor, Inc.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| PK40X256VMD100 | 制造商:Freescale Semiconductor 功能描述:KINETIS 256KFLEX USB LCD |
| PK40X512VLQ100 | 制造商:Freescale Semiconductor 功能描述:KINETIS 512K FLEX USB - Bulk |
| PK4-10R-T | 制造商:Panduit Corp 功能描述:Ring Tongue Terminal 4AWG 47.2mm 14mm Tin 制造商:Panduit Corp 功能描述:RING TERMINAL, LARGE WIRE, KYNAR INSULAT - Bag |
| PK4-12R-T | 制造商:Panduit Corp 功能描述:RING TERMINAL, LARGE WIRE, KYN 制造商:Panduit Corp 功能描述:Ring Tongue Terminal 4AWG 51.3mm 21.8mm Tin 制造商:Panduit Corp 功能描述:RING TERMINAL, LARGE WIRE, KYNAR INSULAT - Bag |
| PK4-14R-T | 制造商:Panduit Corp 功能描述:Ring Tongue Terminal 4AWG 47.2mm 14mm Tin 制造商:Panduit Corp 功能描述:RING TERMINAL, LARGE WIRE, KYN 制造商:Panduit Corp 功能描述:RING TERMINAL, LARGE WIRE, KYNAR INSULAT - Bag |
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