參數(shù)資料
型號(hào): PI5V331
廠商: Pericom Semiconductor Corp.
英文描述: Low ON Resistance Wideband/Video Dual 4-Channel Mux/Demux
中文描述: 低導(dǎo)通電阻寬帶/視頻雙4通道復(fù)用/解復(fù)用
文件頁數(shù): 3/5頁
文件大?。?/td> 159K
代理商: PI5V331
3
PS8117 08/07/97
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PI5V331
Low ON Resistance Wideband Video
Dual 4-Channel Mux/Demux
Dynamic Characteristics
(Over the Operating Range, T
A
= –40°C to +85°C, V
CC
= 5V ±5%)
Parameter
t
ON
t
OFF
Description
Turn On Time
Test Conditions
R
L
= 75
, C
L
= 20 pF, see Fig. 2
R
L
= 75
, C
L
= 20 pF, see Fig. 2
R
L
= 150
, see Fig. 3
R
IN
= 10
; R
L
= 150
, 10 MHz, see Fig. 3
R
L
= 150
, f = 3.58 MHz, see Fig. 1
R
L
= 150
, f = 3.58 MHz, see Fig. 1
V
IN
= 0V, f = 1 MHz
V
IN
= 0V, f = 1 MHz
V
IN
= 0V, f = 1 MHz
R
L
= 150
, 10 MHz, see Fig. 3
Min.
Typ.
2.5
Max.
5
Units
ns
Turn Off Time
1.1
5
ns
B
W
(1)
–3 dB Bandwidth
150
MHz
X
TALK
Crosstalk
–58
dB
D
G
Differential Gain
0.64
%
D
P
Differential Phase
0.27
Deg.
C
IN
(1)
C
OFF
(1)
C
ON
(1)
O
IRR
Input/Enable Capacitance
Capacitance, Switch Off
Capacitance, Switch On
Off Isolation
–38
6
6
pF
pF
pF
dB
20
Power Supply Characteristics
Parameters Description
Test Conditions
(1)
Min.
Typ
(2)
Max.
Units
I
CC
Quiescent Power
Supply Current
V
CC
= Max.
IN = GND or V
CC
0.1
3.0
μA
I
CC
Supply Current per
Input @ TTL HIGH
V
CC
= Max.
IN = 3.4V
(3)
2.5
mA
I
CCD
Supply Current per
Input per MHz
(4)
V
CC
= Max.,
S1, S2, and D Pins Open
EN = GND
Control Input Toggling
50% Duty Cycle
0.25
mA/
MHz
Notes:
1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Per TTL driven input (V
IN
= 3.4V, control inputs only); S1, S2, and D pins do not contribute to Icc.
4. This current applies to the control inputs only and represent the current required to switch internal capacitance at the specified
frequency. The S1, S2, and D I/O pins generate no significant AC or DC currents as they transition. This parameter is not tested,
but is guaranteed by design.
Notes:
1. This parameter is determined by device characterization but is not production tested.
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