參數(shù)資料
型號(hào)： PALCE16V8Q-20PI/4
廠商： LATTICE SEMICONDUCTOR CORP
元件分類： PLD
英文描述： EE CMOS Zero-Power 20-Pin Universal Programmable Array Logic
中文描述： EE PLD, 20 ns, PDIP20
封裝： PLASTIC, DIP-20
文件頁(yè)數(shù)： 16/32頁(yè)
文件大小： 635K
代理商： PALCE16V8Q-20PI/4
PALCE16V8Z-25 (Com’l, Ind)
23
USE
GAL
DEVICES
FOR
NEW
DESIGNS
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C
Ambient Temperature
with Power Applied . . . . . . . . . . . . . .-55°C to +125°C
Supply Voltage
with Respect to Ground . . . . . . . . . . -0.5 V to + 7.0 V
DC Input Voltage . . . . . . . . . . . -0.5 V to VCC + 0.5 V
DC Output or I/O Pin Voltage . . . -0.5 V to VCC + 0.5 V
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current (TA = -40°C to +85°C). . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum Rat-
ings for extended periods may affect device reliability. Pro-
gramming conditions may differ.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (TA)
Operating in Free Air . . . . . . . . . . . . . . . 0°C to +75°C
Supply Voltage (VCC)
with Respect to Ground . . . . . . . . . +4.75 V to +5.25 V
Industrial (I) Devices
Temperature (TA) Operating
in Free Air . . . . . . . . . . . . . . . . . . . . . . -40°C to +85°C
Supply Voltage (VCC)
with Respect to Ground . . . . . . . . . . . +4.5 V to +5.5 V
Operating ranges dene those limits between which the func-
tionality of the device is guaranteed.
DC CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING
RANGES
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. Represents the worst case of HC and HCT standards, allowing compatibility with either.
3. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
4. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
Parameter
Symbol
Parameter Description
Test Description
Min
Max
Unit
VOH
Output HIGH Voltage
VIN = VIH or VIL, VCC = Min
IOH = 6 mA
3.84
V
IOH = 20 A
VCC – 0.1 V
V
VOL
Output LOW Voltage
VIN = VIH or VIL, VCC = Min
IOL = 24 mA
0.5
V
IOL = 6 mA
0.33
V
IOL = 20 A
0.1
V
VIH
Input HIGH Voltage
Guaranteed Input Logical HIGH
Voltage for all Inputs (Notes 1 and 2)
2.0
V
VIL
Input LOW Voltage
Guaranteed Input Logical LOW
Voltage for all Inputs (Notes 1 and 2)
0.9
V
IIH
Input HIGH Leakage Current
VIN = 5.25 V, VCC = Max (Note 3)
10
A
IIL
Input LOW Leakage Current
VIN = 0 V, VCC = Max (Note 3)
–10
A
IOZH
Off-State Output Leakage Current HIGH
VOUT = 5.25 V, VCC = Max
VIN = VIH or VIL (Note 3)
10
A
IOZL
Off-State Output Leakage Current LOW
VOUT = 0 V, VCC = Max
VIN = VIH or VIL (Note 3)
–10
A
ISC
Output Short-Circuit Current
VOUT = 0.5 V, VCC = Max (Note 4)
–30
–150
mA
ICC
Supply Current (Static)
Outputs Open (IOUT = 0 mA)
VCC = Max
f = 0 MHz
15
A
Supply Current (Dynamic)
f = 25 MHz
90
mA
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