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參數(shù)資料
| 型號： | PALC22V10-25PC |
| 廠商： | CYPRESS SEMICONDUCTOR CORP |
| 元件分類： | PLD |
| 英文描述： | Flash-erasable Reprogrammable CMOS PAL Device |
| 中文描述： | OT PLD, 25 ns, PDIP24 |
| 封裝： | 0.300 INCH, PLASTIC, DIP-24 |
| 文件頁數(shù)： | 4/13頁 |
| 文件大小： | 367K |
| 代理商： | PALC22V10-25PC |
PALCE22V10
USE ULTRA37000
TM
FOR
ALL NEW DESIGNS
Document #: 38-03027 Rev. *B
Page 4 of 13
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65
°
C to +150
°
C
Ambient Temperature with
Power Applied.............................................–55
°
C to +125
°
C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12)...........................................–0.5V to +7.0V
DC Voltage Applied to Outputs
in High-Z State...............................................–0.5V to +7.0V
DC Input Voltage............................................–0.5V to +7.0V
Output Current into Outputs (LOW).............................16 mA
DC Programming Voltage.............................................12.5V
Latch-up Current.....................................................> 200 mA
Static Discharge Voltage
(per MIL-STD-883, Method 3015) ............................> 2001V
Operating Range
Range
Ambient
Temperature
0
°
C to +75
°
C
–40
°
C to +85
°
C
–55
°
C to +125
°
C
V
CC
5V
±
5%
5V
±
10%
5V
±
10%
Commercial
Industrial
Military
[1]
Electrical Characteristics
Over the Operating Range
[2]
Parameter
V
OH
Description
Test Conditions
Min.
2.4
Max. Unit
Output HIGH Voltage
V
CC
= Min.,
V
IN
= V
IH
or V
IL
I
OH
= –3.2 mA
I
OH
= –2 mA
I
OL
= 16 mA
I
OL
= 12 mA
Com’l
Mil/Ind
Com’l
Mil/Ind
V
V
OL
Output LOW Voltage
V
CC
= Min.,
V
IN
= V
IH
or V
IL
Guaranteed Input Logical HIGH Voltage for All Inputs
[3]
Guaranteed Input Logical LOW Voltage for All Inputs
[3]
V
SS
< V
IN
< V
CC
, V
CC
= Max.
V
CC
= Max., V
SS
< V
OUT
< V
CC
0.5
V
V
IH
V
IL[4]
I
IX
I
OZ
I
SC
I
CC1
Input HIGH Level
Input LOW Level
Input Leakage Current
Output Leakage Current
Output Short Circuit Current V
CC
= Max., V
OUT
= 0.5V
[5,6]
Standby Power Supply
Current
2.0
–0.5
–10
–40
–30
V
V
μ
A
μ
A
0.8
10
40
–130 mA
90
130
120
120
110
140
130
130
V
CC
= Max.,
V
IN
= GND,
Outputs Open in Unprogrammed
Device
10, 15, 25 ns
5, 7.5 ns
15, 25 ns
10 ns
10, 15, 25 ns
5, 7.5 ns
15, 25 ns
10 ns
Com’l
mA
mA
mA
mA
mA
mA
mA
mA
Mil/Ind
I
CC2[6]
Operating Power Supply
Current
V
CC
= Max., V
IL
= 0V, V
IH
= 3V,
Output Open, Device Programmed
as a 10-bit Counter,
f = 25 MHz
Com’l
Com’l
Mil/Ind
Mil/Ind
Capacitance
[6]
Parameter
C
IN
C
OUT
Endurance Characteristics
[6]
Description
Test Conditions
V
IN
= 2.0V @ f = 1 MHz
V
OUT
= 2.0V @ f = 1 MHz
Min.
Max.
10
10
Unit
pF
pF
Input Capacitance
Output Capacitance
Parameter
Description
Test Conditions
Normal Programming Conditions
Min.
100
Max.
Unit
Cycles
N
Minimum Reprogramming Cycles
Notes:
1. T
is the “instant on” case temperature.
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. V
(Min.) is equal to –3.0V for pulse durations less than 20 ns.
5. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V
OUT
= 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
6. Tested initially and after any design or process changes that may affect these parameters.
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