參數(shù)資料
型號: PA28F400BX-T120
廠商: INTEL CORP
元件分類: PROM
英文描述: 4-MBIT (256K X 16, 512K X 8) BOOT BLOCK FLASH MEMORY FAMILY
中文描述: 256K X 16 FLASH 12V PROM, 120 ns, PDSO40
封裝: 1.110 X 0.525 INCH, PLASTIC, SOP-40
文件頁數(shù): 35/50頁
文件大?。?/td> 559K
代理商: PA28F400BX-T120
28F400BX-T/B, 28F004BX-T/B
STANDARD TEST CONFIGURATION
(1)
STANDARD
AC INPUT/OUTPUT REFERENCE WAVEFORM
290451–14
AC test inputs are driven at V
(2.4 V
) for a Logic ‘‘1’’ and V
OL
(0.45 V
TTL
) for a logic ‘‘0’’. Input timing begins at V
IH
(2.0 V
TTL
) and V
IL
(0.8 V
TTL
). Output timing ends at V
IH
and V
IL
. Input rise and fall times (10%
to 90%)
k
10 ns.
STANDARD
AC TESTING LOAD CIRCUIT
290451–13
C
L
e
100 pF
C
L
Includes Jig Capacitance
R
L
e
3.3 K
X
HIGH SPEED TEST CONFIGURATION
(2)
HIGH SPEED
AC INPUT/OUTPUT REFERENCE WAVEFORM
290451–22
AC test inputs are driven at 3.0V for a Logic ‘‘1’’ and 0.0V for a logic ‘‘0’’.
Input timing begins, and output timing ends, at 1.5V. Input rise and fall times
(10% to 90%)
k
10 ns.
HIGH SPEED
AC TESTING LOAD CIRCUIT
290451–21
C
L
e
30 pF
C
L
Includes Jig Capacitance
R
L
e
3.3 K
X
NOTES:
1. Testing characteristics for 28F400BX-60/28F004BX-60 in standard test configuration and 28F400BX-80/28F004BX-80.
2. Testing characteristics for 28F400BX-60/28F004BX-60 in high speed test configuration.
35
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相關代理商/技術參數(shù)
參數(shù)描述
PA28F400BX-T60 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:4-MBIT (256K X 16, 512K X 8) BOOT BLOCK FLASH MEMORY FAMILY
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PA28F400BX-T80 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:4-MBIT (256K X 16, 512K X 8) BOOT BLOCK FLASH MEMORY FAMILY
PA28F400CV-B60 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:2-MBIT SmartVoltage BOOT BLOCK FLASH MEMORY FAMILY
PA28F400CV-B80 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:2-MBIT SmartVoltage BOOT BLOCK FLASH MEMORY FAMILY