參數(shù)資料
型號: OPA2652U2K5
英文描述: Dual, 700MHz, Voltage-Feedback OPERATIONAL AMPLIFIER
中文描述: 雙通道,700MHz的,電壓反饋運(yùn)算放大器
文件頁數(shù): 2/20頁
文件大小: 297K
代理商: OPA2652U2K5
www.ti.com
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
(1)
1
2
3
4
8
7
6
5
+V
S
Out B
-
In B
+In B
Out A
-
In A
+In A
-
V
S
OPA2652
C52
Pin 1
Top View
SO-8
SOT23-8
SOT23-8 Marking / Pin Orientation
OPA2652
SBOS125A–JUNE 2000–REVISED MAY 2006
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
PACKAGE/ORDERING INFORMATION
(1)
SPECIFIED
TEMPERATURE
RANGE
PACKAGE-
LEAD
PACKAGE
DESIGNATOR
PACKAGE
MARKING
ORDERING
NUMBER
OPA2652U
OPA2652U/2K5
OPA2652E/250
OPA2652E/3K
TRANSPORT MEDIA,
QUANTITY
Rails
Tape and Reel, 2500
Tape and Reel, 250
Tape and Reel, 3000
PRODUCT
OPA2652U
SO-8
D
–40
°
C to +85
°
C
OPA2652U
OPA2652E
SOT23-8
DCN
–40
°
C to +85
°
C
C52
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at
www.ti.com
.
OPA2652
±
6.5
See Thermal Characteristics
±
1.2
±
V
S
–40 to +125
+260
+175
UNIT
V
Supply voltage
Internal power dissipation
Differential input voltage
Input voltage range
Storage temperature range
Lead temperature (SO-8)
Junction temperature, T
J
ESD rating:
Human body model
Machine model
V
V
°C
°
C
°
C
2000
200
V
V
(1)
Stresses beyond those listed under
Absolute Maximum Ratings
may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating
Conditions
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
PIN CONFIGURATION
2
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