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參數(shù)資料
| 型號： | OP27GZ |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | 運動控制電子 |
| 英文描述： | Low-Noise, Precision Operational Amplifier |
| 中文描述： | OP-AMP, 220 uV OFFSET-MAX, 8 MHz BAND WIDTH, CDIP8 |
| 封裝： | HERMETIC SEALED, CERAMIC, DIP-8 |
| 文件頁數(shù)： | 5/16頁 |
| 文件大?。?/td> | 370K |
| 代理商： | OP27GZ |
REV. A
–5–
OP27
OP27N
Limit
OP27G
Limit
OP27GR
Limit
Parameter
Symbol
Conditions
Unit
μ
V Max
nA Max
nA Max
V Min
INPUT OFFSET VOLTAGE
*
INPUT OFFSET CURRENT
INPUT BIAS CURRENT
INPUT VOLTAGE RANGE
COMMON-MODE REJECTION
RATIO
POWER SUPPLY
LARGE-SIGNAL VOLTAGE
GAIN
V
OS
I
OS
IB
IVR
35
35
±
40
±
11
60
50
±
55
±
11
100
75
±
80
±
11
CMRR
PSRR
V
CM
= IVR
V
S
=
±
4 V to
±
18 V
114
10
106
10
100
20
dB Min
μ
V/V Max
A
VO
A
VO
V
O
V
O
P
d
R
L
≥
2 k
, V
O
=
±
10 V
R
L
≥
600
, V
O
=
±
10 V
R
L
≥
2 k
RL2600n
V
O
= 0
1000
800
±
12.0
±
10.0
140
1000
800
±
12.0
±
10.0
140
700
600
+11.5
±
10.0
170
V/mV Min
V/mV Min
V Min
V Min
mW Max
OUTPUT VOLTAGE SWING
POWER CONSUMPTION
NOTE
*
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
WAFER TEST LIMITS
(@ V
S
=
±
15 V, T
A
= 25 C unless otherwise noted.)
DICE CHARACTERISTICS
1. NULL
2. (
–
) INPUT
3. (+) INPUT
4. V
–
6. OUTPUT
7. V+
8. NULL
DIE SIZE 0.109 0.055 INCH, 5995 SQ. MILS
(2.77 1.40mm, 3.88 SQ. mm)
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| OP-27GZ | 制造商:AD 制造商全稱:Analog Devices 功能描述:LOW NOISE, PRECISION OPERATIONAL AMPLIFIER |
| OP27NBC | 制造商:Analog Devices 功能描述: |
| OP27SAJ5/38510 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Analog IC |
| OP27SAZ5/38510 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Analog IC |
| OP280 | 功能描述:紅外發(fā)射源 SMD RoHS:否 制造商:Fairchild Semiconductor 波長:880 nm 射束角:+/- 25 輻射強度: 最大工作溫度:+ 100 C 最小工作溫度:- 40 C 封裝 / 箱體:Side Looker 封裝:Bulk |
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