REV. A
– 2 –
OP227–SPECIFICATIONS
Individual Amplifier Characteristics
(V
S
= 15 V, T
A
= 25 C, unless otherwise noted.)
OP227E
Typ
OP227G
Typ
Parameter
Symbol
Conditions
Min
Max
Min
Max
Unit
m
V
m
V/M
O
nA
INPUT OFFSET VOLTAGE
V
OS
V
OS
/Time
I
OS
I
B
e
n p-p
Note 1
20
80
60
180
LONG-TERM V
OS
STABILITY
INPUT OFFSET CURRENT
Notes 2,4
0.2
1.0
0.4
2.0
7
±
10
0.08
35
±
40
0.20
12
±
15
0.09
75
±
80
0.28
INPUT BIAS CURRENT
nA
m
V p-p
INPUT NOISE VOLTAGE
0.1 Hz to 10 Hz
Notes 3,5
INPUT NOISE VOLTAGE
DENSITY
e
n
f
O
= 10 Hz
3
f
O
= 30 Hz
3
f
O
= 1000 Hz
3
f
O
= 10 Hz
3, 6
f
O
= 30 Hz
3, 6
f
O
= 1000 Hz
3, 6
3.5
3.1
3.0
6.0
4.7
3.9
3.8
3.3
3.2
9.0
5.9
4.6
nV/
Hz
nV/
Hz
nV/
Hz
INPUT NOISE DENSITY
i
n
1.7
1.0
0.4
4.5
2.5
0.7
1.7
1.0
0.4
pA/
Hz
pA/
Hz
pA/
Hz
0.7
INPUT RESISTANCE
Differential Mode
Common Mode
R
IN
R
INCM
IVR
Note 7
1.3
6
3
±
12.3
0.7
4
2
±
12.3
M
W
G
W
V
INPUT VOLTAGE RANGE
COMMON-MODE
REJECTION RATIO
±
11.0
±
11.0
CMRR
V
CM
=
±
11 V
114
126
100
120
dB
POWER SUPPLY
REJECTION RATIO
PSRR
V
S
=
±
4 V to
±
18 V
1
10
2
20
m
V/V
LARGE-SIGNAL
VOLTAGE GAIN
A
VO
R
L
2 k
W
,
V
O
=
±
10 V
R
L
600 k
W
,
V
O
=
±
10 V
R
L
2 k
W
R
L
600
W
R
L
2 k
W
4
Note 4
1000
1800
700
1500
V/mV
800
±
12.0
±
10.0
1.7
1500
±
13.8
±
11.5
2.8
600
±
11.5
±
10.0
1.7
1500
±
13.5
±
11.5
2.8
V/mV
OUTPUT VOLTAGE SWING
V
O
V
V
V/
m
s
MHz
SLEW RATE
SR
GAIN BANDWIDTH PROD.
GBW
5
8
5
8
OPEN-LOOP OUTPUT
RESISTANCE
R
O
P
d
V
O
= 0, I
O
= 0
Each Amplifier
70
70
W
mW
POWER CONSUMPTION
90
140
100
170
OFFSET ADJUSTMENT
RANGE
R
p
= 10 k
W
±
4
±
4
mV
NOTES
1
Input offset voltage measurements are performed by automated test equipment approximately 0.5 seconds after application of power. E Grade specifications are
guaranteed fully warmed up.
2
Long term input offset voltage stability refers to the average trend line of V
OS
vs. time over extended periods after the first 30 days of operation. Excluding the initial
hour of operation, changes in V
OS
during the first 30 days are typically 2.5
m
V. Refer to the Typical Performance Curve.
3
Sample tested.
4
Parameter is guaranteed by design.
5
See test circuit and frequency response curve for 0.1 Hz to 10 Hz tester.
6
See test circuit for current noise measurement.
7
Guaranteed by input bias current.
Specifications subject to change without notice.