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參數(shù)資料
| 型號： | NTE8212 |
| 廠商： | NTE Electronics, Inc. |
| 英文描述： | Integrated Circuit Schottky, 8-Bit Input/Output Port |
| 中文描述： | 集成電路肖特基，8位輸入/輸出端口 |
| 文件頁數(shù)： | 1/4頁 |
| 文件大?。?/td> | 28K |
| 代理商： | NTE8212 |
NTE8212
Integrated Circuit
Schottky, 8–Bit Input/Output Port
Description:
The NTE8212 input/output port is an integrated circuit in a 24–Lead DIP type package and consists
of an 8–bit latch with three–state output buffers along with control and device selection logic. Also
included is a service request flip–flop for the control and generation of interrupts to the microprocessor.
Features:
Fully Parallel 8–Bit Data Register and Buffer
Service Request Flip–Flop for Interrupt Generation
Low Input Load Current: 0.25mA Max
Three State Outputs
Outputs Sink 15mA
3.65V Output High Voltge for Direct Interface to 8080A Processor
Asynchronous Register Clear
Reduces System Package Count
Absolute Maximum Ratings:
(T
A
= +25
°
C, Note 1 unless otherwise specified)
All Output or Supply Voltages
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
All Input Voltages
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output Currents
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating Temperature Range
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage Temperature Range
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
–0.5V to +7V
–1.0V to +5.5V
125mA
0
°
to +70
°
C
–65
°
to +150
°
C
Note 1. Stress above those listed under “Absolute Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and functional operation of the device at these
or any other conditions above those indicated in the operational sections of this specification
is not implied. Exposure to absolute maximum rating conditions for extended periods may
affect device reliability.
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