
-3-
Nichia STSE-CG2137B
<Cat.No.031205>
6.RELIABILITY
(1) TEST ITEMS AND RESULTS
Test Item
Resistance to
Soldering Heat
Solderability
Thermal Shock
Standard
Test Method
JEITA ED-4701
300 302
JEITA ED-4701
300 303
JEITA ED-4701
300 307
JEITA ED-4701
100 105
JEITA ED-4701
200 203
JEITA ED-4701
400 401
JEITA ED-4701
400 401
JEITA ED-4701
200 201
JEITA ED-4701
100 103
JEITA ED-4701
200 202
Test Conditions
Note
1 time
Number of
Damaged
0/100
Tsld=260 ± 5°C, 10sec.
3mm from the base of the epoxy bulb
Tsld=235 ± 5°C, 5sec.
(using flux)
0°C ~ 100°C
15sec. 15sec.
-40°C ~ 25°C ~ 100°C ~ 25°C
30min.
5min.
30min.
5min.
25°C ~ 65°C ~ -10°C
90%RH 24hrs./1cycle
Load 5N (0.5kgf)
0° ~ 90° ~ 0° bend 2 times
Load 10N (1kgf)
10 ± 1 sec.
Ta=100°C
1 time
over 95%
100 cycles
0/100
0/100
Temperature Cycle
100 cycles
0/100
Moisture Resistance Cyclic
10 cycles
0/100
Terminal Strength
(bending test)
Terminal Strength
(pull test)
High Temperature Storage
No noticeable
damage
No noticeable
damage
1000hrs.
0/100
0/100
0/100
Temperature Humidity
Storage
Low Temperature Storage
Ta=60°C, RH=90%
1000hrs.
0/100
Ta=-40°C
1000hrs.
0/100
Steady State Operating Life
Steady State Operating Life
of High Humidity Heat
Steady State Operating Life
of Low Temperature
Ta=25°C, I
F
=30mA
1000hrs.
0/100
60°C, RH=90%, I
F
=20mA
500hrs.
0/100
Ta=-30°C, I
F
=20mA
1000hrs.
0/100
(2) CRITERIA FOR JUDGING THE DAMAGE
Item
Forward Voltage
Reverse Current
Luminous Intensity
*) U.S.L.
:
Upper Standard Level **) L.S.L.
:
Lower Standard Level
Criteria for Judgement
Min.
-
-
L.S.L.**)
$
0.7
Symbol
V
F
I
R
I
V
Test Conditions
I
F
=20mA
V
R
=5V
I
F
=20mA
Max.
U.S.L.*)
$
1.1
U.S.L.*)
$
2.0
-