NO4 NO7 Inhibit
參數(shù)資料
型號(hào): NLAS4051DTR2
廠商: ON Semiconductor
文件頁數(shù): 4/11頁
文件大?。?/td> 0K
描述: IC MUX/DEMUX 8X1 16TSSOP
標(biāo)準(zhǔn)包裝: 1
功能: 多路復(fù)用器/多路分解器
電路: 1 x 8:1
導(dǎo)通狀態(tài)電阻: 33 歐姆
電壓電源: 單/雙電源
電壓 - 電源,單路/雙路(±): 2.5 V ~ 5 V,±3 V
電流 - 電源: 40µA
工作溫度: -55°C ~ 125°C
安裝類型: 表面貼裝
封裝/外殼: 16-TSSOP(0.173",4.40mm 寬)
供應(yīng)商設(shè)備封裝: 16-TSSOP
包裝: 剪切帶 (CT)
其它名稱: NLAS4051DTR2OSCT
Figure 2. Logic Diagram
NO4
NO7
Inhibit
NO6
NO3
ADDA
LOGIC
ADDB
ADDC
NO5
NO2
NO1
NO0
COM
NLAS4051
http://onsemi.com
2
TRUTH TABLE
Inhibit
Address
ON SWITCHES*
C
B
A
1
X
don’t care
X
don’t care
X
don’t care
All switches open
0
COMNO0
0
1
COMNO1
0
1
0
COMNO2
0
1
COMNO3
0
1
0
COMNO4
0
1
0
1
COMNO5
0
1
0
COMNO6
0
1
COMNO7
*NO and COM pins are identical and interchangeable. Either may be considered
an input or output; signals pass equally well in either direction.
MAXIMUM RATINGS
Parameter
Symbol
Value
Unit
Negative DC Supply Voltage
(Referenced to GND)
VEE
7.0 to
)0.5
V
Positive DC Supply Voltage (Note 1)
(Referenced to GND)
(Referenced to VEE)
VCC
0.5 to
)7.0
0.5 to
)7.0
V
Analog Input Voltage
VIS
VEE 0.5 to VCC )0.5
V
Digital Input Voltage
(Referenced to GND)
VIN
0.5 to 7.0
V
DC Current, Into or Out of Any Pin
I
$50
mA
Storage Temperature Range
TSTG
65 to
)150
_C
Lead Temperature, 1 mm from Case for 10 Seconds
TL
260
_C
Junction Temperature under Bias
TJ
)150
_C
Thermal Resistance
SOIC
TSSOP
QSOP
qJA
143
164
°C/W
Power Dissipation in Still Air,
SOIC
TSSOP
QSOP
PD
500
450
mW
Moisture Sensitivity
MSL
Level 1
Flammability Rating
Oxygen Index: 30% 35%
FR
UL 94 V0 @ 0.125 in
ESD Withstand Voltage
Human Body Model (Note 2)
Machine Model (Note 3)
Charged Device Model (Note 4)
VESD
u2000
u200
u1000
V
Latchup Performance
Above VCC and Below GND at 125°C (Note 5)
ILATCHUP
$300
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The absolute value of VCC $|VEE| ≤ 7.0.
2. Tested to EIA/JESD22A114A.
3. Tested to EIA/JESD22A115A.
4. Tested to JESD22C101A.
5. Tested to EIA/JESD78.
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