參數(shù)資料
型號: NCV7356
廠商: ON SEMICONDUCTOR
元件分類: CAN
英文描述: Single Wire CAN Transceiver(單線CAN收發(fā)器)
中文描述: 單線CAN收發(fā)器(單線的CAN收發(fā)器)
文件頁數(shù): 8/24頁
文件大?。?/td> 225K
代理商: NCV7356
NCV7356
http://onsemi.com
8
TIMING MEASUREMENT LOAD CONDITIONS
Normal and High Voltage Wake-Up Mode
High-Speed Mode
min load / min tau
3.3 k / 540 pF
Additional 140 tool resistance
to ground in parallel
min load / max tau
3.3 k / 1.2 nF
max load / min tau
200 / 5.0 nF
Additional 120 tool resistance
to ground in parallel
max load / max tau
200 / 20 nF
ELECTRICAL CHARACTERISTICS
(5.0 V
V
BAT
27 V, -40
°
C
T
A
125
°
C, unless otherwise specified.)
AC CHARACTERISTICS
(See Figures 3, 4, and 5)
Characteristic
Symbol
Condition
Min
Typ
Max
Unit
Transmit Delay in Normal and Wake-Up Mode,
Bus Rising Edge (Notes 12, 13)
t
Tr
Min and Max Loads per Timing
Measurement Load Conditions
2.0
-
6.3
s
Transmit Delay in Wake-Up Mode to V
ihWU
,
Bus Rising Edge (Notes 12, 14)
t
TWUr
Min and Max Loads per Timing
Measurement Load Conditions
2.0
-
18
s
Transmit Delay in Normal Mode,
Bus Falling Edge (Notes 15, 16)
t
Tf
Min and Max Loads per Timing
Measurement Load Conditions
1.8
-
10
s
Transmit Delay in Wake-Up Mode,
Bus Falling Edge (Notes 15, 16)
t
TWU1f
Min and Max Loads per Timing
Measurement Load Conditions
3.0
-
13.7
s
Transmit Delay in High-Speed Mode,
Bus Rising Edge (Notes 12, 17)
t
THSr
Min and Max Loads per Timing
Measurement Load Conditions
0.1
-
1.5
s
Transmit Delay in High-Speed Mode,
Bus Falling Edge (Notes 16, 18)
t
THSf
Min and Max Loads per Timing
Measurement Load Conditions
0.04
-
3.0
s
Receive Delay, All Active Modes (Note 19)
t
DR
CANH High to Low Transition
0.3
-
1.0
s
Receive Delay, All Active Modes (Note 19)
t
RD
CANH Low to High Transition
0.3
-
1.0
s
Input Minimum Pulse Length,
All Active Modes (Note 17)
t
mpDR
t
mpRD
CANH High to Low Transition
CANH Low to High Transition
0.1
0.1
-
-
1.0
1.0
s
Wake-Up Filter Time Delay
t
WUF
See Figure 4
10
-
70
s
Receive Blanking Time, After
TxD L-H
Transition
t
rb
See Figure 5
0.5
-
6.0
s
TxD Timeout Reaction Time
t
tout
Normal and High-Speed Mode
-
17
-
ms
TxD Timeout Reaction Time
t
toutwu
Wake-Up Mode
-
17
-
ms
Delay from Normal to High-Speed and
High Voltage Wake-Up Mode
t
dnhs
-
-
-
30
ms
Delay from High-Speed and High Voltage
Wake-Up to Normal Mode
t
dhsn
-
-
-
30
ms
Delay from Normal to Standby Mode
t
dsby
V
BAT
= 6.0 V to 27 V
-
-
500
s
Delay from Sleep to Normal Mode
t
dsnwu
V
BAT
= 6.0 V to 27 V
-
-
50
ms
Delay from Standby to Sleep Mode (Note 20)
t
dsleep
V
BAT
= 6.0 V to 27 V
100
250
500
ms
12.Minimum signal delay time is measured from the TxD voltage threshold to CANH = 1.0 V. load should be min per the Timing Measurement
Load Conditions table.
13.Maximum signal delay time is measured from the TxD voltage threshold to CANH = 3.5 V at V
BAT
= 27 V, CANH = 2.8 V at V
BAT
= 5.0 V. load
should be max per the Timing Measurement Load Conditions table.
14.Maximum signal delay time is measured from the TxD voltage threshold to CANH = 9.2 V. V
ihwumax
= V
ihwufix
,
max + V
goff
= 7.9 V + 1.3 V = 9.2 V. load should be max per the Timing Measurement Load Conditions table.
15.Minimum signal delay time is measured from the TxD voltage threshold to CANH = 3.5 V at V
BAT
= 27 V, CANH = 2.8 V at V
BAT
= 5.0 V. load
should be min per the Timing Measurement Load Conditions table.
16.Maximum signal delay time is measured from the TxD voltage threshold to CANH = 1 V. load should be max per the Timing Measurement
Load Conditions table.
17.Maximum signal delay time is measured from the TxD voltage threshold to CANH = 3.5 V. load should be max per the Timing Measurement
Load Conditions table.
18.Minimum signal delay time is measured from the TxD voltage threshold to CANH = 3.5 V. load should be min per the Timing Measurement
Load Conditions table.
19.Receive delay time is measured from the rising / falling edge crossing of the nominal V
ih
value on CANH to the falling (V
cmos_il_max
) / rising
(V
cmos_ih_min
) edge of RxD. This parameter is tested by applying a square wave signal to CANH. The minimum slew rate for the bus rising
and falling edges is 50 V/ s. The low level on bus is always 0 V. For normal mode and high-speed mode testing the high level on bus is 4 V.
For HVWU mode testing the high level on bus is V
BAT
- 2 V. Relaxation of this non-critical parameter from 0.15 s to 0.10 s may be addressed
in future revisions of GMW3089.
20.Tested on 14 Pin package only.
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