參數(shù)資料
型號: NBXDBA014
廠商: ON SEMICONDUCTOR
英文描述: 3.3 V, 62.5 MHz / 125 MHz LVPECL Clock Oscillator
中文描述: 3.3伏特,62.5兆赫/ 125兆赫的LVPECL時鐘振蕩器
文件頁數(shù): 2/6頁
文件大小: 109K
代理商: NBXDBA014
NBXDBA014
http://onsemi.com
2
FSEL
OE
GND
CLK
V
DD
CLK
1
2
3
6
5
4
Figure 2. Pin Connections
(Top View)
Table 1. PIN DESCRIPTION
Pin No.
Symbol
I/O
Description
ááááááááááááááááááááááááááááááááá
ááááááááááááááááááááááááááááááááá
ááááááááááááááááááááááááááááááááá
ááááááááááááááááááááááááááááááááá
ááááááááááááááááááááááááááááááááá
ááááááááááááááááááááááááááááááááá
ááááááááááááááááááááááááááááááááá
ááááááááááááááááááááááááááááááááá
1
OE
LVTTL/LVCMOS
Control Input
LVTTL/LVCMOS
Frequency Select pin description Table 3.
Output Enable Pin. When left floating pin defaults to logic HIGH and output is active.
See OE pin description Table 2.
2
FSEL
Output Frequency Select Pin. Pin will default to logic HIGH when left open. See Output
LVPECL Output
Positive power supply voltage. Voltage should not exceed 3.3 V
±
10%.
V
TT
= V
DD
- 2 V.
5
ááááááááááááááááááááááááááááááááá
CLK
DD
Non-Inverted Clock Output. Typically loaded with 50 receiver termination resistor to
V
TT
= V
DD
- 2 V.
Table 2. OUTPUT ENABLE TRI-STATE FUNCTION
OE Pin
Output Pin
Open
Active
HIGH Level
Active
LOW Level
High Z
Table 3. OUTPUT FREQUENCY SELECT
FSEL Pin
Output Frequency (MHz)
Open
(pin will float high)
62.5
HIGH Level
62.5
LOW Level
125
Table 4. ATTRIBUTES
Characteristic
Value
ESD Protection
Human Body Model
Machine Model
2 kV
200 V
Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test
1. For additional Moisture Sensitivity information, refer to Application Note AND8003/D.
Table 5. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Units
V
DD
Positive Power Supply
GND = 0 V
4.6
V
I
out
LVPECL Output Current
Continuous
Surge
25
50
mA
T
A
Operating Temperature Range
-40 to +85
°
C
T
stg
Storage Temperature Range
-55 to +120
°
C
T
sol
Wave Solder
See Figure 6
260
°
C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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