參數(shù)資料
型號: NBC12430
廠商: ON SEMICONDUCTOR
英文描述: 3.3V/5V Programmable PLL Synthesized Clock Generator(3.3V/5V可編程PLL合成時鐘發(fā)生器)
中文描述: 3.3V/5V的可編程鎖相環(huán)路合成時鐘發(fā)生器(3.3V/5V的可編程PLL頻率合成時鐘發(fā)生器)
文件頁數(shù): 11/20頁
文件大小: 203K
代理商: NBC12430
NBC12430, NBC12430A
http://onsemi.com
11
Most of the signals available on the TEST output pin are
useful only for performance verification of the device itself.
However, the PLL bypass mode may be of interest at the
board level for functional debug. When T[2:0] is set to 110,
the device is placed in PLL bypass mode. In this mode the
S_CLOCK input is fed directly into the M and N dividers.
The N divider drives the F
OUT
differential pair and the M
counter drives the TEST output pin. In this mode the
S_CLOCK input could be used for low speed board level
functional test or debug. Bypassing the PLL and driving
F
OUT
directly gives the user more control on the test clocks
sent through the clock tree. Figure 7 shows the functional
setup of the PLL bypass mode. Because the S_CLOCK is a
CMOS level the input frequency is limited to 250 MHz or
less. This means the fastest the F
OUT
pin can be toggled via
the S_CLOCK is 250 MHz as the minimum divide ratio of
the N counter is 1. Note that the M counter output on the
TEST output will not be a 50% duty cycle due to the way the
divider is implemented.
T2
T1
T0
TEST
(Pin 20)
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
SHIFT REGISTER OUT
HIGH
FREF
M COUNTER OUT
F
OUT
LOW
PLL BYPASS
F
OUT
4
Figure 5. Parallel Interface Timing Diagram
M[8:0]
N[1:0]
P_LOAD
éééé
éééé
éééé
éééé
t
h
M, N to P_LOAD
VALID
s
Figure 6. Serial Interface Timing Diagram
S_CLOCK
S_DATA
S_LOAD
Last
Bit
C1
C2
C3
S_DATA to S_CLOCK
C4
C5
C6
C7
C8
C9
C10
C11
C12
T2
T1
T0
N1
N0
M6
M5
M4
M3
M2
M1
M0
First
Bit
t
s
t
s
t
h
t
h
S_CLOCK to S_LOAD
C13
C14
M7
M8
Figure 7. Serial Test Clock Block Diagram
FDIV4
MCNT
LOW
F
OUT
MCNT
FREF
HIGH
TEST
MUX
7
0
TEST
F
OUT
(VIA ENABLE GATE)
N
(1, 2, 4, 8)
0
1
PLL 12430
LATCH
Reset
PLOAD
M COUNTER
SLOAD
T0
T1
T2
VCO_CLK
SHIFT
REG
14-BIT
DECODE
SDATA
SCLOCK
MCNT
FREF_EXT
T2=T1=1, T0=0: Test Mode
SCLOCK is selected, MCNT is on TEST output, SCLOCK
PLOAD acts as reset for test pin latch. When latch reset, T2 data is shifted out TEST pin.
N is on F
OUT
pin.
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
NBC12430/D 制造商:未知廠家 制造商全稱:未知廠家 功能描述:3.3 V/5V Programmable PLL Synthesized Clock Generator
NBC12430_06 制造商:ONSEMI 制造商全稱:ON Semiconductor 功能描述:3.3V/5V Programmable PLL Synthesized Clock Generator
NBC12430A 制造商:ONSEMI 制造商全稱:ON Semiconductor 功能描述:3.3V/5VProgrammable PLL Synthesized Clock Generator
NBC12430AFA 功能描述:時鐘發(fā)生器及支持產(chǎn)品 3.3V/5V Programmable RoHS:否 制造商:Silicon Labs 類型:Clock Generators 最大輸入頻率:14.318 MHz 最大輸出頻率:166 MHz 輸出端數(shù)量:16 占空比 - 最大:55 % 工作電源電壓:3.3 V 工作電源電流:1 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:QFN-56
NBC12430AFAG 功能描述:鎖相環(huán) - PLL 3.3V/5V Programmable PLL Clock Generator RoHS:否 制造商:Silicon Labs 類型:PLL Clock Multiplier 電路數(shù)量:1 最大輸入頻率:710 MHz 最小輸入頻率:0.002 MHz 輸出頻率范圍:0.002 MHz to 808 MHz 電源電壓-最大:3.63 V 電源電壓-最小:1.71 V 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝 / 箱體:QFN-36 封裝:Tray