參數(shù)資料
型號: MX29F001TTI-90
元件分類: EEPROM
英文描述: EEPROM
中文描述: EEPROM的
文件頁數(shù): 18/43頁
文件大小: 570K
代理商: MX29F001TTI-90
18
REV. 2.3, JUL. 09, 2002
P/N: PM0515
MX29F001T/B
SWITCHING TEST CIRCUITS
SWITCHING TEST WAVEFORMS(I) for 29F001T/B-70, 29F001T/B-90, 29F001T/B-12
SWITCHING TEST WAVEFORMS(II) for 29F001T/B-55
3.0 V
0 V
1.5V
TEST POINTS
INPUT
1.5V
OUTPUT
AC TESTING: Inputs are driven at 3.0V for a logic "1" and 0V for a logic "0".
Input pulse rise and fall times are < 5ns.
2.0V
2.4 V
0.45 V
0.8V
TEST POINTS
INPUT
2.0V
0.8V
OUTPUT
AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".
Input pulse rise and fall times are < 10ns.
DEVICE UNDER
TEST
DIODES=IN3064
OR EQUIVALENT
CL
1.2K ohm
1.6K ohm
+5V
CL=100pF Including jig capacitance for 29F001T/B-70, 29F001T/B-90, 29F001T/B-12
30pF Including jig capacitance for 29F001T/B-55
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