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參數(shù)資料
| 型號： | MSP430C1101IPM |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | 16-BIT, MROM, 8 MHz, RISC MICROCONTROLLER |
| 文件頁數(shù)： | 23/39頁 |
| 文件大?。?/td> | 762K |
| 代理商： | MSP430C1101IPM |
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MSP430C11x1, MSP430F11x1A
MIXED SIGNAL MICROCONTROLLER
SLAS241H SEPTEMBER 1999 REVISED SEPTEMBER 2004
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DW, PW, or DGV
RGE
I/O
DESCRIPTION
NAME
NO.
I/O
DESCRIPTION
P1.0/TACLK
13
I/O
General-purpose digital I/O pin/Timer_A, clock signal TACLK input
P1.1/TA0
14
I/O
General-purpose digital I/O pin/Timer_A, capture: CCI0A input,
compare: Out0 output/BSL transmit
P1.2/TA1
15
I/O
General-purpose digital I/O pin/Timer_A, capture: CCI1A input,
compare: Out1 output
P1.3/TA2
16
I/O
General-purpose digital I/O pin/Timer_A, capture: CCI2A input,
compare: Out2 output
P1.4/SMCLK/TCK
17
I/O
General-purpose digital I/O pin/SMCLK signal output/test clock, input
terminal for device programming and test
P1.5/TA0/TMS
18
I/O
General-purpose digital I/O pin/Timer_A, compare: Out0 output/test
mode select, input terminal for device programming and test
P1.6/TA1/TDI/TCLK
19
20
I/O
General-purpose digital I/O pin/Timer_A, compare: Out1 output/test
data input or test clock input
P1.7/TA2/TDO/TDI
20
21
I/O
General-purpose digital I/O pin/Timer_A, compare: Out2 output/test
data output terminal or data input during programming
P2.0/ACLK
8
6
I/O
General-purpose digital I/O pin/ACLK output
P2.1/INCLK
9
7
I/O
General-purpose digital I/O pin/Timer_A, clock signal at INCLK
P2.2/CAOUT/TA0
10
8
I/O
General-purpose digital I/O pin/Timer_A, capture: CCI0B input/
comparator_A, output/BSL receive
P2.3/CA0/TA1
11
10
I/O
General-purpose digital I/O pin/Timer_A, compare: Out1 output/
comparator_A, input
P2.4/CA1/TA2
12
11
I/O
General-purpose digital I/O pin/Timer_A, compare: Out2 output/
comparator_A, input
P2.5/ROSC
3
24
I/O
General-purpose digital I/O pin/input for external resistor that defines
the DCO nominal frequency
RST/NMI
7
5
I
Reset or nonmaskable interrupt input
TEST
1
22
I
Selects test mode for JTAG pins on Port1. The device protection fuse
is connected to TEST.
VCC
2
23
Supply voltage
VSS
4
2
Ground reference
XIN
6
4
I
Input terminal of crystal oscillator
XOUT
5
3
O
Output terminal of crystal oscillator
QFN Pad
NA
Package Pad
NA
QFN package pad connection to VSS recommended.
TDO or TDI is selected via JTAG instruction.
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| MSP430C1101IPW | 制造商:TI 制造商全稱:Texas Instruments 功能描述:MIXED SIGNAL MICROCONTROLLER |
| MSP430C1101IRGE | 制造商:TI 制造商全稱:Texas Instruments 功能描述:MIXED SIGNAL MICROCONTROLLER |
| MSP430C111 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:MIXED SIGNAL MICROCONTROLLERS |
| MSP430C1111IDW | 制造商:TI 制造商全稱:Texas Instruments 功能描述:MIXED SIGNAL MICROCONTROLLER |
| MSP430C1111IPW | 制造商:TI 制造商全稱:Texas Instruments 功能描述:MIXED SIGNAL MICROCONTROLLER |
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