
Electrical characteristics
MPC5607B Microcontroller Data Sheet, Rev. 5
Freescale Semiconductor
57
ECC circuitry provides correction of single bit faults and is used to improve further automotive reliability results. Some units
will experience single bit corrections throughout the life of the product with no impact to product reliability.
Table 27 shows the FLASH_BIU settings versus frequency of operation. Refer to the device reference manual for definitions
of these bit fields.
Table 25. Flash module life
Symbol
C
Parameter
Conditions
Value
Unit
Min
Typ
Max
P/E
CC C Number of program/erase
cycles per block for 16 KB
blocks over the operating
temperature range (TJ)
—
100000
—
cycles
P/E
CC C Number of program/erase
cycles per block for 32 KB
blocks over the operating
temperature range (TJ)
—
10000
100000
—
cycles
P/E
CC C Number of program/erase
cycles per block for 128 KB
blocks over the operating
temperature range (TJ)
—
1000
100000
—
cycles
Retention
CC C Minimum data retention at 85
°C average ambient
temperature1
1 Ambient temperature averaged over duration of application, not to exceed recommended product operating
temperature range.
Blocks with
0–1,000 P/E cycles
20
—
years
Blocks with
1,001–10,000 P/E
cycles
10
—
years
Blocks with
10,001–100,000 P/E
cycles
5—
—
years
Table 26. Flash read access timing
Symbol
C
Parameter
Conditions1
1 V
DD = 3.3 V ± 10% / 5.0 V ± 10%, TA = 40 to 125 °C, unless otherwise specified
Max
Unit
fREAD
CC
P Maximum frequency for Flash reading
2 wait states
64
MHz
C
1 wait state
40
C
0 wait states
20