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參數(shù)資料
| 型號： | MPC5604PGF0VLL4 |
| 廠商： | FREESCALE SEMICONDUCTOR INC |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | 32-BIT, FLASH, 40 MHz, MICROCONTROLLER, PQFP100 |
| 封裝： | 14 X 14 MM, 1.40 MM HEIGHT, 0.50 MM PITCH, ROHS COMPLIANT LQFP-100 |
| 文件頁數(shù)： | 32/99頁 |
| 文件大?。?/td> | 1130K |
| 代理商： | MPC5604PGF0VLL4 |
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MPC5604P Microcontroller Data Sheet, Rev. 7
Freescale Semiconductor
38
3
Electrical characteristics
3.1
Introduction
This section contains device electrical characteristics as well as temperature and power considerations.
This microcontroller contains input protection against damage due to high static voltages. However, it is advisable to take
precautions to avoid application of any voltage higher than the specified maximum rated voltages.
To enhance reliability, unused inputs can be driven to an appropriate logic voltage level (VDD or VSS). This can be done by the
internal pull-up or pull-down resistors, which are provided by the device for most general purpose pins.
The following tables provide the device characteristics and its demands on the system.
In the tables where the device logic provides signals with their respective timing characteristics, the symbol “CC” for Controller
Characteristics is included in the Symbol column.
In the tables where the external system must provide signals with their respective timing characteristics to the device, the symbol
“SR” for System Requirement is included in the Symbol column.
CAUTION
All of the following parameter values can vary depending on the application and must be
confirmed during silicon characterization or silicon reliability trial.
3.2
Parameter classification
The electrical parameters are guaranteed by various methods. To give the customer a better understanding, the classifications
listed in Table 6 are used and the parameters are tagged accordingly in the tables where appropriate.
NOTE
The classification is shown in the column labeled “C” in the parameter tables where
appropriate.
Table 6. Parameter classifications
Classification tag
Tag description
P
Those parameters are guaranteed during production testing on each individual device.
C
Those parameters are achieved by the design characterization by measuring a statistically
relevant sample size across process variations.
T
Those parameters are achieved by design characterization on a small sample size from typical
devices under typical conditions unless otherwise noted. All values shown in the typical column
are within this category.
D
Those parameters are derived mainly from simulations.
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