MPC5604B/C Microcontroller Data Sheet, Rev. 9
Electrical characteristics
Freescale Semiconductor
30
4
Electrical characteristics
4.1
Introduction
This section contains electrical characteristics of the device as well as temperature and power considerations.
This product contains devices to protect the inputs against damage due to high static voltages. However, it is advisable to take
precautions to avoid applying any voltage higher than the specified maximum rated voltages.
To enhance reliability, unused inputs can be driven to an appropriate logic voltage level (VDD or VSS). This could be done by
the internal pull-up and pull-down, which is provided by the product for most general purpose pins.
The parameters listed in the following tables represent the characteristics of the device and its demands on the system.
In the tables where the device logic provides signals with their respective timing characteristics, the symbol “CC” for Controller
Characteristics is included in the Symbol column.
In the tables where the external system must provide signals with their respective timing characteristics to the device, the symbol
“SR” for System Requirement is included in the Symbol column.
4.2
Parameter classification
The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better
understanding, the classifications listed in
Table 7 are used and the parameters are tagged accordingly in the tables where
appropriate.
NOTE
The classification is shown in the column labeled “C” in the parameter tables where
appropriate.
4.3
NVUSRO register
Bit values in the Non-Volatile User Options (NVUSRO) Register control portions of the device configuration, namely electrical
parameters such as high voltage supply and oscillator margin, as well as digital functionality (watchdog enable/disable after
reset).
For a detailed description of the NVUSRO register, please refer to the device reference manual.
4.3.1
NVUSRO[PAD3V5V] field description
The DC electrical characteristics are dependent on the PAD3V5V bit value.
Table 8 shows how NVUSRO[PAD3V5V] controls
the device configuration.
Table 7. Parameter classifications
Classification tag
Tag description
P
Those parameters are guaranteed during production testing on each individual device.
C
Those parameters are achieved by the design characterization by measuring a statistically
relevant sample size across process variations.
T
Those parameters are achieved by design characterization on a small sample size from typical
devices under typical conditions unless otherwise noted. All values shown in the typical column
are within this category.
D
Those parameters are derived mainly from simulations.