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          參數(shù)資料
          

          


          


          
型號(hào)：
MPC5604BF1MLL6

          

          
廠商：
FREESCALE SEMICONDUCTOR INC

          

          
元件分類：
微控制器/微處理器

          

          
英文描述：
MICROCONTROLLER, PQFP100

          

          
封裝：
14 X 14 MM, 1.40 MM HEIGHT, 0.50 MM PITCH, LQFP-100

          

          
文件頁(yè)數(shù)：
60/104頁(yè)

          

          
文件大小：
953K

          

          
代理商：
MPC5604BF1MLL6


          

          

          

	
          
    
    

    
          
	
          Electrical characteristics
          MPC5604B/C Microcontroller Data Sheet, Rev. 9
          Freescale Semiconductor
          59
          4.12.3
          Absolute maximum ratings (electrical sensitivity)
          Based on two different tests (ESD and LU) using specific measurement methods, the product is stressed in order to determine
          its performance in terms of electrical sensitivity.
          4.12.3.1
          Electrostatic discharge (ESD)
          Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according
          to each pin combination. The sample size depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This
          test conforms to the AEC-Q100-002/-003/-011 standard.
          4.12.3.2
          Static latch-up (LU)
          Two complementary static tests are required on six parts to assess the latch-up performance:
          A supply overvoltage is applied to each power supply pin.
          A current injection is applied to each input, output and configurable I/O pin.
          Table 33. EMI radiated emission measurement1,2
          1 EMI testing and I/O port waveforms per IEC 61967-1, -2, -4
          2 For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your
          local marketing representative.
          Symbol
          C
          Parameter
          Conditions
          Value
          Unit
          Min
          Typ
          Max
          —
          SR — Scan range
          —
          0.150
          —
          1000 MHz
          fCPU SR — Operating frequency
          —
          64
          —
          MHz
          VDD_LV SR — LV operating voltages
          —
          1.28
          —
          V
          SEMI CC T Peak level
          VDD = 5V, TA =25°C,
          LQFP144 package
          Test conforming to IEC 61967-2,
          fOSC = 8 MHz/fCPU = 64 MHz
          No PLL frequency
          modulation
          —
          18
          dBV
          ±2% PLL frequency
          modulation
          —
          14
          dBV
          Table 34. ESD absolute maximum ratings1 2
          1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated
          Circuits.
          2 A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
          specification requirements. Complete DC parametric and functional testing shall be performed per applicable
          device specification at room temperature followed by hot temperature, unless specified otherwise in the device
          specification.
          Symbol
          C
          Ratings
          Conditions
          Class
          Max value
          Unit
          VESD(HBM) CC T Electrostatic discharge voltage
          (Human Body Model)
          TA = 25 °C
          conforming to AEC-Q100-002
          H1C
          2000
          V
          VESD(MM) CC T Electrostatic discharge voltage
          (Machine Model)
          TA = 25 °C
          conforming to AEC-Q100-003
          M2
          200
          VESD(CDM) CC T Electrostatic discharge voltage
          (Charged Device Model)
          TA = 25 °C
          conforming to AEC-Q100-011
          C3A
          500
          750 (corners)
          
    
          
    
    
          


          


          

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