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參數(shù)資料
| 型號： | MPC5602DF1VLL3 |
| 廠商： | FREESCALE SEMICONDUCTOR INC |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | 32-BIT, FLASH, 32 MHz, MICROCONTROLLER, PQFP100 |
| 封裝： | 14 X 14 MM, 1.40 MM HEIGHT, 0.50 MM PITCH, ROHS COMPLIANT, LQFP-100 |
| 文件頁數(shù)： | 41/83頁 |
| 文件大小： | 1473K |
| 代理商： | MPC5602DF1VLL3 |
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MPC5602D Microcontroller Data Sheet, Rev. 4
Preliminary—Subject to Change Without Notice
Electrical characteristics
Freescale Semiconductor
46
— Corrupted program counter
— Unexpected reset
— Critical data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the reset pin or the oscillator pins for 1 second.
To complete these trials, ESD stress can be applied directly on the device. When unexpected behavior is detected, the
software can be hardened to prevent unrecoverable errors occurring.
4.12.2
Electromagnetic interference (EMI)
The product is monitored in terms of emission based on a typical application. This emission test conforms to the IEC 61967-1
standard, which specifies the general conditions for EMI measurements.
4.12.3
Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the product is stressed in order to determine
its performance in terms of electrical sensitivity.
4.12.3.1
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according
to each pin combination. The sample size depends on the number of supply pins in the device (3 parts * (n + 1) supply pin).
This test conforms to the AEC-Q100-002/-003/-011 standard.
Table 32. EMI radiated emission measurement1 2
1 EMI testing and I/O port waveforms per IEC 61967-1, -2, -4
2 For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your
local marketing representative.
Symbol
C
Parameter
Conditions
Value
Unit
Min
Typ
Max
—
SR — Scan range
—
0.150
—
1000 MHz
fCPU SR — Operating frequency
—
48
—
MHz
VDD_LV SR — LV operating voltages
—
1.28
—
V
SEMI CC T Peak level
VDD = 5 V, TA =25°C,
100 LQFP package
Test conforming to IEC 61967-2,
fOSC = 8 MHz/fCPU = 48 MHz
No PLL frequency
modulation
—
18
dBV
± 2% PLL frequency
modulation
——
143
3 All values need to be confirmed during device validation
dBV
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