參數(shù)資料
型號(hào)： MPC5602BEMLL
廠商： FREESCALE SEMICONDUCTOR INC
元件分類(lèi)： 微控制器/微處理器
英文描述： 32-BIT, FLASH, 60 MHz, MICROCONTROLLER, PQFP100
封裝： 14 X 14 MM, 1.40 MM HEIGHT, 0.50 MM PITCH, LQFP-100
文件頁(yè)數(shù)： 26/72頁(yè)
文件大?。?/td> 971K
代理商： MPC5602BEMLL
MPC5604B/C Microcontroller Data Sheet Data Sheet, Rev. 4
Electrical characteristics
Freescale Semiconductor
32
4.12
Electromagnetic compatibility (EMC) characteristics
Susceptibility tests are performed on a sample basis during product characterization.
4.12.1
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical application environment and simplified
MCU software. It should be noted that good EMC performance is highly dependent on the user application and the software in
particular.
Therefore it is recommended that the user apply EMC software optimization and prequalification tests in relation with the EMC
level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
— Corrupted program counter
— Unexpected reset
— Critical data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the reset pin or the oscillator pins for 1 second.
To complete these trials, ESD stress can be applied directly on the device. When unexpected behavior is detected, the
software can be hardened to prevent unrecoverable errors occurring.
4.12.2
Electromagnetic interference (EMI)
The product is monitored in terms of emission based on a typical application. This emission test conforms to the IEC 61967-1
standard, which specifies the general conditions for EMI measurements.
1 V
DD = 3.3 V ± 10% / 5.0 V ± 10%, TA = 40 to 125 °C, unless otherwise specified
Table 28. EMI radiated emission measurement1,2
1 EMI testing and I/O port waveforms per IEC 61967-1, -2, -4
2 For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your
local marketing representative.
Symbol
C
Parameter
Conditions
Value
Unit
Min
Typ
Max
—
S
R
— Scan range
—
0.15
0
1000 MHz
fCPU
S
R
— Operating frequency
—
64
—
MHz
VDD_L
V
S
R
— LV operating
voltages
—
1.28
—
V
SEMI
C
T Peak level
VDD = 5 V, TA =25°C,
LQFP144 package
Test conforming to IEC 61967-2,
fOSC = 8 MHz/fCPU = 64 MHz
No PLL frequency
modulation
—
18
dB
V
± 2% PLL
frequency
modulation
—
143
3 All values need to be confirmed during device validation
dB
V
Because
of
an
order
from
the
United
States
International
Trade
Commission,
BGA-packaged
product
lines
and
part
numbers
indicated
here
currently
are
not
available
from
Freescale
for
import
or
sale
in
the
United
States
prior
to
September
2010:
MPC5604BxMG
products
in
208
MAPBGA
packages
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