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參數(shù)資料
| 型號(hào)： | MM54C90W/883 |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類(lèi)： | 計(jì)數(shù)器 |
| 英文描述： | CMOS SERIES, ASYN NEGATIVE EDGE TRIGGERED 3-BIT UP DECADE COUNTER, CDFP14 |
| 文件頁(yè)數(shù)： | 1/6頁(yè) |
| 文件大?。?/td> | 14K |
| 代理商： | MM54C90W/883 |
Original Creation Date: 10/26/95
Last Update Date: 05/19/97
Last Major Revision Date: 04/02/97
MNMM54C90-X REV 1A0
MICROCIRCUIT DATA SHEET
4-BIT DECADE COUNTER
General Description
The MM54C90 decade counter is a complementary MOS (CMOS) integrated circuit constructed
with N- and P-channel enhancement mode transistors. The 4-bit decade counter can reset to
zero or preset to nine by applying appropriate logic level on the R01, R02, R91 and R92
inputs. Also, a separate flip-flop on the A-bit enables the user to operate it as a
divide-by-2, 5 or 10 frequency counter. Counting occurs on the negative going edge of the
input pulse. All inputs are protected against static discharge damage.
NS Part Numbers
MM54C90J/883
MM54C90W/883
Industry Part Number
MM54C90
Prime Die
MM54C90
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1
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