參數(shù)資料
型號(hào): MCP6V28T-E/MNY
廠商: Microchip Technology
文件頁數(shù): 48/50頁
文件大?。?/td> 0K
描述: IC OPAMP AUTO-ZERO SGL 8MSOP
標(biāo)準(zhǔn)包裝: 3,300
放大器類型: 自動(dòng)調(diào)零
電路數(shù): 1
輸出類型: 滿擺幅
轉(zhuǎn)換速率: 1 V/µs
增益帶寬積: 2MHz
電流 - 輸入偏壓: 7pA
電壓 - 輸入偏移: 2µV
電流 - 電源: 620µA
電流 - 輸出 / 通道: 22mA
電壓 - 電源,單路/雙路(±): 2.3 V ~ 5.5 V
工作溫度: -40°C ~ 125°C
安裝類型: 表面貼裝
封裝/外殼: 8-WFDFN 裸露焊盤
供應(yīng)商設(shè)備封裝: 8-TDFN(2x3)
包裝: 帶卷 (TR)
2011 Microchip Technology Inc.
DS25007B-page 7
MCP6V26/7/8
1.3
Timing Diagrams
FIGURE 1-1:
Amplifier Start Up.
FIGURE 1-2:
Offset Correction Settling
Time.
FIGURE 1-3:
Output Overdrive Recovery.
FIGURE 1-4:
Chip Select (MCP6V28).
1.4
Test Circuits
The circuits used for the DC and AC tests are shown in
Figure 1-5 and Figure 1-6. Lay the bypass capacitors
out as discussed in Section 4.3.10, Supply Bypass-
ing and Filtering. RN is equal to the parallel combina-
tion of RF and RG to minimize bias current effects.
FIGURE 1-5:
AC and DC Test Circuit for
Most Non-Inverting Gain Conditions.
FIGURE 1-6:
AC and DC Test Circuit for
Most Inverting Gain Conditions.
The circuit in Figure 1-7 tests the op amp input’s
dynamic behavior (i.e., IMD, tSTR, tSTL and tODR). The
potentiometer balances the resistor network (VOUT
should equal VREF at DC). The op amp’s common
mode input voltage is VCM =VIN/2. The error at the
input (VERR) appears at VOUT with a noise gain of
10 V/V.
FIGURE 1-7:
Test Circuit for Dynamic
Input Behavior.
VDD
VOS
VOS +50V
VOS –50V
tSTR
0V
2.3V to 5.5V
2.3V
VIN
VOS
VOS +50 V
tSTL
VIN
VOUT
VDD
VSS
tODR
VDD/2
VIL
High-Z
tON
VIH
CS
tOFF
VOUT
-2 A
High-Z
ISS
-2 A
300 A
1A
IDD
1A
300 A
VDD/5 MΩ
ICS
VDD/5 MΩ
5pA
(typical)
VDD
RG
RF
RN
VOUT
VIN
VDD/3
1F
CL
RL
VL
100 nF
RISO
MCP6V2X
U1
VDD
RG
RF
RN
VOUT
VDD/3
VIN
1F
CL
RL
VL
100 nF
RISO
MCP6V2X
U1
VDD
VOUT
1F
CL
RL
VL
100 nF
RISO
20.0 k
Ω
24.9
Ω
20.0 k
Ω
50
Ω
VIN
VREF
0.1%
25 turn
20.0 k
Ω
20.0 k
Ω
0.1%
2.4
9
2.
4
9
MCP6V2X
U1
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