參數(shù)資料
型號(hào): MCF51JE256VLK
廠商: Freescale Semiconductor
文件頁數(shù): 7/47頁
文件大?。?/td> 0K
描述: IC MCU 32BIT 256K FLASH 80LQFP
標(biāo)準(zhǔn)包裝: 480
系列: MCF51JE
核心處理器: Coldfire V1
芯體尺寸: 32-位
速度: 50MHz
連通性: CAN,EBI/EMI,I²C,SCI,SPI,USB OTG
外圍設(shè)備: LVD,PWM,WDT
輸入/輸出數(shù): 47
程序存儲(chǔ)器容量: 256KB(256K x 8)
程序存儲(chǔ)器類型: 閃存
RAM 容量: 32K x 8
電壓 - 電源 (Vcc/Vdd): 1.8 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 12x12b,D/A 1x12b
振蕩器型: 外部
工作溫度: -40°C ~ 105°C
封裝/外殼: 80-LQFP
包裝: 托盤
Preliminary Electrical Characteristics
MCF51JE256 Datasheet, Rev. 4
Freescale Semiconductor
15
3
Preliminary Electrical Characteristics
This section contains electrical specification tables and reference timing diagrams for the
MCF51JE256/128 microcontroller, including detailed information on power considerations, DC/AC
electrical characteristics, and AC timing specifications.
The electrical specifications are preliminary and are from previous designs or design simulations. These
specifications may not be fully tested or guaranteed at this early stage of the product life cycle. These
specifications will, however, be met for production silicon. Finalized specifications will be published after
complete characterization and device qualifications have been completed.
NOTE
The parameters specified in this data sheet supersede any values found in the module
specifications.
3.1
Parameter Classification
The electrical parameters shown in this supplement are guaranteed by various methods. To give the
customer a better understanding, the following classification is used and the parameters are tagged
accordingly in the tables where appropriate:
NOTE
The classification is shown in the column labeled “C” in the parameter tables where
appropriate.
3.2
Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not
guaranteed. Stress beyond the limits specified in the following table may affect device reliability or cause
permanent damage to the device. For functional operating conditions, refer to the remaining tables in this
section.
Table 4. Parameter Classifications
P
Those parameters are guaranteed during production testing on each individual device.
C
Those parameters are achieved by the design characterization by measuring a statistically relevant
sample size across process variations.
T
Those parameters are achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted. All values shown in the typical column are within this
category.
D
Those parameters are derived mainly from simulations.
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