參數(shù)資料
型號(hào)： MCF51CN128CGT
廠商： Freescale Semiconductor
文件頁(yè)數(shù)： 6/48頁(yè)
文件大?。?/td> 0K
描述： IC MCU 32BIT 128K FLASH 48-QFN
產(chǎn)品培訓(xùn)模塊： MCF51CN Family - Ultimate Ethernet Solutions
Tower System
標(biāo)準(zhǔn)包裝： 260
系列： MCF51CN
核心處理器： Coldfire V1
芯體尺寸： 32-位
速度： 50MHz
連通性： 以太網(wǎng)，I²C，SCI，SPI
外圍設(shè)備： LVD，PWM，WDT
輸入/輸出數(shù)： 38
程序存儲(chǔ)器容量： 128KB（128K x 8）
程序存儲(chǔ)器類(lèi)型： 閃存
RAM 容量： 24K x 8
電壓 - 電源 (Vcc/Vdd)： 1.8 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器： A/D 12x12b
振蕩器型： 外部
工作溫度： -40°C ~ 85°C
封裝/外殼： 48-VFQFN 裸露焊盤(pán)
包裝： 托盤(pán)
產(chǎn)品目錄頁(yè)面： 732 (CN2011-ZH PDF)
配用： TWR-MCF51CN-ND - KIT TOWER BOARD
TWR-MCF51CN-KIT-ND - KIT TOWER BOARD/SERIAL/ELEVATOR
MCF51CN128 ColdFire Microcontroller Data Sheet, Rev. 4
Electrical Characteristics
Freescale Semiconductor
14
3.5
ESD Protection and Latch-Up Immunity
Although damage from electrostatic discharge (ESD) is much less common on these devices than on early CMOS circuits,
normal handling precautions should be used to avoid exposure to static discharge. Qualification tests are performed to ensure
that these devices can withstand exposure to reasonable levels of static without suffering any permanent damage.
All ESD testing is in conformity with AEC-Q100 Stress Test Qualification for Automotive Grade Integrated Circuits. During
the device qualification ESD stresses were performed for the human body model (HBM), the machine model (MM) and the
charge device model (CDM).
A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device specification. Complete
DC parametric and functional testing is performed per the applicable device specification at room temperature followed by hot
temperature, unless specified otherwise in the device specification.
Table 6. ESD and Latch-up Test Conditions
Model
Description
Symbol
Value
Unit
Human
Body
Series resistance
R1
1500
Ω
Storage capacitance
C
100
pF
Number of pulses per pin
—
3
Machine
Series resistance
R1
0
Ω
Storage capacitance
C
200
pF
Number of pulses per pin
—
3
Latch-up
Minimum input voltage limit
—
– 2.5
V
Maximum input voltage limit
—
7.5
V
Table 7. ESD and Latch-Up Protection Characteristics
No.
Rating1
1 Parameter is achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted.
Symbol
Min
Max
Unit
1
Human body model (HBM)
VHBM
± 2000
—
V
2
Machine model (MM)
VMM
± 200
—
V
3
Charge device model (CDM)
VCDM
± 500
—
V
4
Latch-up current at TA = 85°CILAT
± 100
—
mA
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
MCF51CN128CL 制造商:Rochester Electronics LLC 功能描述: 制造商:Freescale Semiconductor 功能描述:
MCF51CN128CLH 功能描述:32位微控制器 - MCU 32-Bit 128K Flash w/ On-Chip Ethernet RoHS:否 制造商:Texas Instruments 核心:C28x 處理器系列:TMS320F28x 數(shù)據(jù)總線(xiàn)寬度:32 bit 最大時(shí)鐘頻率:90 MHz 程序存儲(chǔ)器大小:64 KB 數(shù)據(jù) RAM 大小:26 KB 片上 ADC:Yes 工作電源電壓:2.97 V to 3.63 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:LQFP-80 安裝風(fēng)格:SMD/SMT
MCF51CN128CLH 制造商:Freescale Semiconductor 功能描述:IC 32BIT MCU COLDFIRE 50.33MHZ LQFP64
MCF51CN128CLK 功能描述:32位微控制器 - MCU 32-Bit 128K Flash w/ On-Chip Ethernet RoHS:否 制造商:Texas Instruments 核心:C28x 處理器系列:TMS320F28x 數(shù)據(jù)總線(xiàn)寬度:32 bit 最大時(shí)鐘頻率:90 MHz 程序存儲(chǔ)器大小:64 KB 數(shù)據(jù) RAM 大小:26 KB 片上 ADC:Yes 工作電源電壓:2.97 V to 3.63 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:LQFP-80 安裝風(fēng)格:SMD/SMT
MCF51CN128CLK 制造商:Freescale Semiconductor 功能描述:IC 32BIT MCU COLDFIRE 50.33MHZ LQFP80
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